Dr. John V. Foreman
at US Army RDECOM
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 15 April 2011 Open Access Paper
Paul Ruffin, Christina Brantley, Eugene Edwards, J. Keith Roberts, William Chew, Larry Warren, Paul Ashley, Henry Everitt, Eric Webster, John Foreman, Mohan Sanghadasa, Sihon Crutcher, Mark Temmen, Vijay Varadan, Devlin Hayduke, Pae Wu, Christopher Khoury, Yang Yang, Tong-Ho Kim, Tuan Vo-Dinh, April Brown, John Callahan
Proceedings Volume 7980, 798002 (2011) https://doi.org/10.1117/12.878970
KEYWORDS: Sensors, Raman spectroscopy, Combustion, Missiles, Gallium, Acoustics, Nanotechnology, Microfluidics, Carbon, Nanowires

Proceedings Article | 1 May 2009 Paper
Proceedings Volume 7311, 731109 (2009) https://doi.org/10.1117/12.818741
KEYWORDS: Semiconductors, Semiconductor lasers, Zinc oxide, Gallium nitride, Terahertz radiation, Silicon carbide, Pulsed laser operation, Wide bandgap semiconductors, Switches, Sapphire lasers

Proceedings Article | 7 February 2009 Paper
John Foreman, Henry Everitt, Jianqiu Yang, Jie Liu
Proceedings Volume 7214, 721405 (2009) https://doi.org/10.1117/12.811561
KEYWORDS: Zinc oxide, Excitons, Luminescence, Quantum efficiency, Photons, Nanoparticles, Absorption, Particles, Atmospheric particles, Atrial fibrillation

Proceedings Article | 15 February 2008 Paper
V. Avrutin, M. Reshchikov, J. Nie, N. Izyumskaya, R. Shimada, Ü. Özgür, J. Foreman, H. Everitt, C. Litton, H. Morkoç
Proceedings Volume 6895, 68950Y (2008) https://doi.org/10.1117/12.764132
KEYWORDS: Ions, Zinc oxide, Sapphire, Plasma, Oxygen, Luminescence, Optical properties, Molecular beam epitaxy, Control systems, Excitons

Proceedings Article | 8 February 2007 Paper
J. Xie, Ü. Özgür, Y. Fu, X. Ni, H. Morkoç, C. K. Inoki, T. S. Kuan, J. Foreman, H. Everitt
Proceedings Volume 6473, 647304 (2007) https://doi.org/10.1117/12.706936
KEYWORDS: Gallium nitride, Transmission electron microscopy, Metalorganic chemical vapor deposition, Silicon carbide, Sapphire, Diodes, Epitaxial lateral overgrowth, Tin, Nickel, Thin films

Showing 5 of 6 publications
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