KEYWORDS: Charge-coupled devices, Surveillance, Electrons, Modulation transfer functions, Capacitance, Image sensors, Clocks, Airborne reconnaissance, Imaging systems, Signal to noise ratio
Time-Delay and Integration (TDI) CCD sensors have been proven to increase the effective sensitivity in imaging applications where the image is scanned across the focal plane. This paper describes the development of a 6032 element, 32-stage TDI imager for airborne reconnaissance applications. The device is fabricated using a 3-poly 3-phase NMOS process, incorporating buried channel CCDs throughout. It is one-side buttable to produce an array of over 12,000 contiguous elements and is capable of read rates of over 4000 lines per second. For fast readout, the design incorporates dual horizontal CCDs for a total of four outputs in the abutted configuration. The architecture also allows dynamic selection in the number of TDI stages.
Time-delay and integration (TDI) CCD sensors have been proven to increase the effective sensitivity in linescan imaging applications. This paper describes the design and initial test results of a 6032 element, 32-stage TDI imager for airborne reconnaissance applications. The device is fabricated using a 3-poly 3-phase NMOS process, incorporating buried channel CCDs throughout. It is one-side buttable to produce an array of over 12,000 contiguous elements and is capable of read rates of over 4000 lines per second. For fast readout, the design incorporates dual horizontal CCDs for a total of four outputs in the abutted configuration. The architecture also allows dynamic selection in the number of TDI stages.
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