Dr. John C. Stover
Owner/Manager at Scatter Works Inc
SPIE Involvement:
Track Chair | Author | Instructor
Publications (67)

Proceedings Article | 13 May 2019 Paper
Proceedings Volume 10985, 1098507 (2019) https://doi.org/10.1117/12.2519147
KEYWORDS: Sapphire, Absorption, Bidirectional reflectance transmission function, Surface finishing, Scatter measurement, Specular reflections, Polishing, Reflection, Surface roughness

Proceedings Article | 5 October 2016 Presentation + Paper
John Stover, Sven Schroeder, Chris Staats, Vladimir Lopushenko, Eugene Church
Proceedings Volume 9961, 996102 (2016) https://doi.org/10.1117/12.2238567
KEYWORDS: Light scattering, Bidirectional reflectance transmission function, Geometrical optics, Scattering, Diffraction, Spatial frequencies, Gold, Scatter measurement, Diffraction gratings, Metrology

Proceedings Article | 29 July 2016 Paper
Proceedings Volume 9904, 99043H (2016) https://doi.org/10.1117/12.2231808
KEYWORDS: Light scattering, Exoplanets, Telescopes, Statistical modeling, Coating, Light scattering, Titanium, Planets, Solid modeling, Scatter measurement, Space telescopes

Proceedings Article | 28 September 2015 Paper
Proceedings Volume 9629, 962904 (2015) https://doi.org/10.1117/12.2193858
KEYWORDS: Bidirectional reflectance transmission function, Polarization, Imaging systems, Short wave infrared radiation, Lens design, Tolerancing, Inspection, Light, Hyperspectral imaging, Domes

Proceedings Article | 24 September 2015 Paper
Proceedings Volume 9628, 96280K (2015) https://doi.org/10.1117/12.2190986
KEYWORDS: Bidirectional reflectance transmission function, Scatter measurement, Particles, Stars, Optical testing, Space telescopes, Diamond, Mirrors, Telescopes, Statistical analysis

Showing 5 of 67 publications
Proceedings Volume Editor (8)

Showing 5 of 8 publications
Conference Committee Involvement (19)
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Optical Metrology and Inspection for Industrial Applications VIII
11 October 2021 | Nantong, JS, China
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Showing 5 of 19 Conference Committees
Course Instructor
SC1003: Optical Scatter Metrology for Industry
The course emphasizes quantifying, measuring and understanding scatter. Optical scatter, originally used almost exclusively to characterize the stray light generated by optically smooth surfaces, is now being used as a fast, economical way to monitor the surface texture requirements in a variety of industry applications. For example, as the lighting industry moves to LED’s scatter from a huge number of components is being measured for analysis in stray radiation codes. Texture is an important requirement for the metal producing industry and it changes with roll wear. The appearance of every day appliances (from door hinges to computer cases) varies dramatically with texture. The quality of flat panel displays depends on the scatter characteristics of the screen and components behind it. SEMI and ASTM have responded to the new applications with "scatter standards" to help communication between manufacturers, vendors and customers. The course starts with easier to analyze optical applications and then explores the transition to rougher industry surfaces, where the measurements are easier, but the analysis is harder. Between a good optical mirror and a concrete sidewalk there are thousands of industry surfaces that can be monitored with scatter metrology. There are two key points for these "in-between" surfaces: (1) If the texture changes - the scatter changes and (2) these changes (and product quality) cannot be adequately monitored by a single variable - such as RMS Roughness, Haze or Gloss. Students are asked to share as much as they can of their scatter metrology issues.
SC020: Optical Scattering: Measurement and Analysis
Optical scatter can be used as a sensitive indicator of surface and bulk defects in many processes. In its various quantitative forms (BRDF, TIS, DSC), it has been used to calculate and map component parameters such as surface texture statistics, particle size, stray radiation and surface appearance. Originally used almost exclusively in the optics industry, it is now finding use as a source of fast, non-contact metrology in a variety of industries where defect-free surfaces are important (defense optics, semiconductors, computer disks, flat panel displays, and surface appearance). The use of scattering standards in the semiconductor industry has become much more important over the last ten years and SEMI has introduced a suite of written standards that are useful across many industries. The course emphasizes quantifying, understanding and measuring scatter. Modeling scatter is emphasized in SC492 taught by Thomas Germer.
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