Dr. John Van Naarden
at L3Harris Technologies Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 September 2020 Presentation + Paper
Proceedings Volume 11530, 115300O (2020) https://doi.org/10.1117/12.2574160
KEYWORDS: Calibration, Sensors, Temperature metrology, Imaging systems, Cooling systems, Detection and tracking algorithms, Image quality

Proceedings Article | 7 September 2018 Presentation + Paper
Proceedings Volume 10764, 107640F (2018) https://doi.org/10.1117/12.2322147
KEYWORDS: Calibration, Mirrors, Infrared imaging, Terbium, Satellites, Space mirrors, Infrared radiation, Printed circuit board testing, Aerospace engineering, Imaging systems

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