Mr. Jon E. Meyer Profile

Jon E. Meyer

at KLA-Tencor Corp

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 26 March 1999 Paper

In-process optical measurement and data graphing of paper sheets using Sherlock32 and Visual Basic

Jon Meyer

Proceedings Volume 3645, (1999) https://doi.org/10.1117/12.343789

KEYWORDS: Cameras, Visualization, Machine vision, Calibration, Inspection, Human-machine interfaces, Process control, Tolerancing, Imaging systems, Frame grabbers

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Proceedings Article | 15 April 1994 Paper

Voxel-based spatial display

Duncan MacFarlane, George Schultz, Paul Higley, Jon Meyer

Proceedings Volume 2177, (1994) https://doi.org/10.1117/12.173876

KEYWORDS: 3D displays, Optical fibers, Prototyping, Liquid crystals, Visualization, Switching, LCDs, Glasses, 3D volumetric displays, UV optics

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Proceedings Article | 5 February 1992 Paper

Experiments on soft x-ray laser development in a tabletop capillary discharge

Jorge Rocca, Mario Marconi, Benito Szapiro, Jon Meyer

Proceedings Volume 1551, (1992) https://doi.org/10.1117/12.134826

KEYWORDS: Capillaries, Plasma, X-rays, X-ray lasers, Diodes, Carbon, Spectrographs, Laser development, Ions, Grazing incidence

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