Mr. Jongkeun Oh Profile

Jongkeun Oh

at samsung electronics

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Publications (4)

Proceedings Article | 23 November 2024 Presentation + Paper

Development of laser-assisted CD correction system in EUV masks

JongKeun Oh, Geonhui Park, YongWoo Kim, JongJu Park, JungJin Kim, SangHee Lee, Hyun Yoon, Seryeyohan Cho, KiHoon Choi

Proceedings Volume 13216, 132161Y (2024) https://doi.org/10.1117/12.3034358

KEYWORDS: Critical dimension metrology, Laser development, Extreme ultraviolet, Photomasks, Deep ultraviolet, Quality management, Quality control, Wet etching, Transmittance, Reflection

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Proceedings Article | 28 June 2013 Paper

Progressive defects caused by crosstalk between mask fabrication processes

Jongkeun Oh, Junyeol Choi, Jaehyuck Choi, Han-shin Lee, Hyungho Koh, Byunggook Kim, Chanuk Jeon

Proceedings Volume 8701, 870107 (2013) https://doi.org/10.1117/12.2032735

KEYWORDS: Etching, Chlorine, Photomasks, Ions, Mask making, Inspection, Air contamination, Chlorine gas, Crystals, Chemical analysis

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Most of defects generated in mask fabrication processes have been mainly created during each unit process. It becomes more important to detect and remove smaller defects on mask as pattern nodes keep shrinking. Each unit processes are getting not only more challenging to sustain mask quality and defect level but also more influencing on other processes for smaller pattern nodes. New type of defects based on such influences (crosstalk) between different processes is starting to emerge, which is requesting for a revision of defect reduction strategy because dealing with crosstalk defects is directly related with quality and TAT of mask manufacturing. It is relatively difficult to properly understand root-cause or working mechanism of defects generated by crosstalk between different processes. This is because interaction between different processes from defect generation perspectives has hardly been studied. In this paper, we introduce emerging progressive defects created while etched masks are undergoing cleaning process or subsequent events of moving to next process or temporary storage. We will investigate how etch gas residues on mask surface remaining after etching process interact with cleaning chemicals or moisture from subsequent process or environment to trigger defect generation and its growth. We will also examine effects of POD outgassing on generation of crosstalk progressive defect. Based on this understanding, appropriate solutions to mitigate defects caused by crosstalk between mask fabrication processes will be proposed. It is believed that new type of progressive defects caused by crosstalk between different mask fabrication processes will be more flourishing in the near future where mask blank materials, mask manufacturing processes, and chemicals need to diversify in order to meet much tighter specifications of mask quality. Therefore, it is very crucial to have right understandings on the interactions between various processes and eradicate possible root-causes of defect generations.

Proceedings Article | 20 October 2008 Paper

A new paradigm for haze improvement: retardation of haze occurrence by creating mask substrate insensitive to chemical contamination level

Han-Shin Lee, Jaehyuck Choi, Jin-Sik Jung, Jong-Keun Oh, Soo-Jung Kang, Hae-Young Jeong, Sang-Gyun Woo, HanKu Cho

Proceedings Volume 7122, 712217 (2008) https://doi.org/10.1117/12.801422

KEYWORDS: Air contamination, Ions, Resistance, Sulfur, Photomasks, Contamination, Transmittance, Surface roughness, Chemical analysis, Molecules

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Proceedings Article | 19 May 2008 Paper

Prevention of chemical residue from growing into Haze defect on PSM pattern edge after normal cleaning process

Jaehyuck Choi, Jin-sik Jung, Han-shin Lee, Jongkeun Oh, Soojung Kang, Haeyong Jeong, Yonghoon Kim, HanKu Cho

Proceedings Volume 7028, 702818 (2008) https://doi.org/10.1117/12.793049

KEYWORDS: Air contamination, Ions, Oxides, Photomasks, Industrial chemicals, Profiling, Sulfur, Scanning probe microscopy, Information operations, Silica

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