A measurement system is described for acquiring the gain distributions of avalanche photodiodes (APDs) in a range of
low average gain. The system is based on an ultralow-noise capacitive transimpedance amplifier to readout the charges
generated in an APD. The low noise level of the readout circuit about 7 electrons at the sampling rate of 200 Hz enables
us to characterize the gain distributions. The gain distribution of a commercial silicon (Si) APD measured at gain of 3.29
using this system is presented.
A scheme to distinguish entangled two-photon-polarization states (ETP) from two independent it entangled one-photon-polarization states is proposed. Using this scheme, the experimental generation of ETP by parametric down-conversion is confirmed through the anti-correlations between three orthogonal two-photon-polarization states. The estimated fraction of ETP among the correlated photon pairs is 37% in the present experimental setup.
Speckle patterns having fractal properties are produced in the image plane as well as in the diffraction regions of a planar diffuser. Such a pattern has no definite speckle size and exhibits a statistical self-similar feature within a limited extent. The intensity correlation function is shown to obey a power-law, which is a typical property of fractal distributions.
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