CONFERENCE PROCEEDINGS
Advanced Search
Kety M. Jimenez Tejeda
at Univ degli Studi di Padova
SPIE Involvement:
Author
Publications (3)
Proceedings Article | 26 April 2019 Paper
EUV reflective ellipsometry in laboratory: determination of the optical constants and phase retarder properties of SiO2 at hydrogen Lyman–alpha
Nadeem Ahmed, P. Nicolosi, A. E. Gaballah, K. Jimenez, P. Zuppella
Proceedings Volume 11032, 110320V (2019) https://doi.org/10.1117/12.2520834
KEYWORDS: Reflectivity, Polarimetry, Wave plates, Polarization, Extreme ultraviolet, Reflectometry, Ellipsometry, Hydrogen, Polarizers, Phase shifts
Proceedings Article | 31 May 2017 Paper
A table top polarimetric facility for the EUV spectral range: implementations and characterization
A. E. H. Gaballah, P. Zuppella, Nadeem Ahmed, K. Jimenez, G. Pettinari, A. Gerardino, P. Nicolosi
Proceedings Volume 10235, 102350X (2017) https://doi.org/10.1117/12.2265592
KEYWORDS: Polarizers, Polarization, Reflectometry, Gold, Optical components, Polarimetry, Extreme ultraviolet, Reflectivity, Aluminum, Wave plates, Mirrors, Multilayers, X-ray optics, EUV optics, Reflection, Absorption
Proceedings Article | 15 May 2017 Paper
Optical and structural characterization of Nb, Zr, Nb/Zr, Zr/Nb thin films on Si3N4 membranes windows
K. Jimenez, A. E. H. Gaballah, Nadeem Ahmed, P. Zuppella, P. Nicolosi
Proceedings Volume 10236, 102360K (2017) https://doi.org/10.1117/12.2267348
KEYWORDS: Silicon films, Silicon, Reflectivity, Synchrotrons, Optical filters, Free electron lasers, Niobium, Zirconium, Transmittance, Extreme ultraviolet, Thin films, Synchrotron radiation
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top