Dr. Kevin Füchsel
CEO at Quantum Optics Jena GmbH
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 2 May 2012 Paper
Matthias Kroll, Martin Otto, Thomas Käsebier, Kevin Füchsel, Ralf Wehrspohn, Ernst-Bernhard Kley, Andreas Tünnermann, Thomas Pertsch
Proceedings Volume 8438, 843817 (2012) https://doi.org/10.1117/12.922380
KEYWORDS: Silicon, Solar cells, Absorption, Reflectivity, Interfaces, Optical coatings, Dielectrics, Antireflective coatings, Nanostructures, Etching

Proceedings Article | 2 May 2012 Paper
Proceedings Volume 8438, 84380M (2012) https://doi.org/10.1117/12.923748
KEYWORDS: Silicon, Nanostructuring, Solar cells, Nanolithography, Silicon films, Transparent conductors, Oxides, Etching, Interfaces, Reflectivity

Proceedings Article | 4 October 2011 Paper
Proceedings Volume 8168, 81680R (2011) https://doi.org/10.1117/12.896774
KEYWORDS: Transmittance, Plasma, Near infrared, Thin films, Zinc oxide, Oxides, Reflectivity, Refractive index, Optical properties, Sputter deposition

Proceedings Article | 4 October 2011 Paper
A. Szeghalmi, M. Arnold, A. Berger, N. Schammelt, K. Fuechsel, M. Knez, E. Kley, D. R. Zahn, A. Tuennermann
Proceedings Volume 8168, 81680K (2011) https://doi.org/10.1117/12.896818
KEYWORDS: Gold, Atomic layer deposition, Iridium, Thin films, Electrodes, Multilayers, Infrared imaging, Transmission electron microscopy, Coating, Metals

Proceedings Article | 21 April 2011 Paper
Proceedings Volume 8065, 80650B (2011) https://doi.org/10.1117/12.883239
KEYWORDS: Silicon, Solar cells, Oxides, Indium, Silicon films, Tin, Transparent conductors, Nanostructuring, Refractive index, Antireflective coatings

Showing 5 of 7 publications
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