Prof. Ki-Nam Joo Profile

Prof. Ki-Nam Joo

Assistant Professor at Chosun Univ

SPIE Involvement:

Conference Program Committee | Author

Proceedings Article | 20 November 2024 Poster + Paper

Polarization state change calibration and system verification of a Mueller matrix spectroscopic ellipsometer based on reflective objectives

Seonile Seo, Ki-Nam Joo

Proceedings Volume 13241, 132411P (2024) https://doi.org/10.1117/12.3036020

KEYWORDS: Polarization, Reflection, Mueller matrices, Calibration, Spectroscopy, Objectives, Polysomnography, Data modeling, Critical dimension metrology, Spectroscopic ellipsometry

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Proceedings Article | 20 November 2024 Poster + Paper

Possibility of hyperspectral imaging based on retardance

Seongwook Jang, Ki-Nam Joo

Proceedings Volume 13241, 132411O (2024) https://doi.org/10.1117/12.3036015

KEYWORDS: Hyperspectral imaging, Bandpass filters, Spectral resolution, Wave plates, Polarizers, Polarization, Phase measurement, Matrices, Cameras, Spatial resolution

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Proceedings Article | 20 May 2022 Presentation + Paper

Surface figure metrology based on geometric phase components

K.-N. Joo, H. M. Park, H. B. Jeong, C. Guthery, D. Kim, Y. S. Ghim

Proceedings Volume 12137, 121370C (2022) https://doi.org/10.1117/12.2624872

KEYWORDS: Polarization, Wavefronts, Shearing interferometers, Metrology, Aspheric lenses

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Proceedings Article | 5 March 2022 Presentation + Paper

Fiber-based two-wavelength heterodyne displacement interferometer

Yanqi Zhang, Ki-Nam Joo, Felipe Guzman

Proceedings Volume 12008, 120080K (2022) https://doi.org/10.1117/12.2609998

KEYWORDS: Interferometers, Heterodyning, Optical filters, Mirrors, Prototyping, Interferometry, Environmental sensing, Laser sources, Photodetectors, Nanoimprint lithography

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Proceedings Article | 26 March 2019 Paper

Measurement system of film structure by interferometry and ellipsometry

K.-N. Joo, Y. H. Yun

Proceedings Volume 10959, 1095927 (2019) https://doi.org/10.1117/12.2516148

KEYWORDS: Interferometry, Ellipsometry, Thin films, Polarization, Reflectometry, Calibration, Reflection, Profiling, Beam splitters, Spectroscopy

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Proceedings Article | 28 August 2016 Paper

Improvement of spectrally resolved interferometry without direction ambiguity and dead zone

Young Ho Yun, Ki-Nam Joo

Proceedings Volume 9960, 996010 (2016) https://doi.org/10.1117/12.2235301

KEYWORDS: Interferometry, Distance measurement, Mirrors, Spectroscopy, Beam splitters, Phase shifting, Neodymium, Light emitting diodes, Refractive index, Calibration

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Proceedings Article | 1 July 2015 Paper

Multi-channel optical gap sensor based on spectrally-resolved interferometry

Byeong Kwon Kim, Yong Bum Seo, Ki-Nam Joo

Proceedings Volume 9655, 965502 (2015) https://doi.org/10.1117/12.2183997

KEYWORDS: Sensors, Distance measurement, Interferometry, Optical sensors, Spectroscopy, Coarse wavelength division multiplexing, Light sources, Ocean optics, Precision measurement, Motion measurement

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Proceedings Article | 22 June 2015 Paper

Dual spectrally resolved interferometry to improve measurement range

Y. B. Seo, B. K. Kim, K.-N. Joo

Proceedings Volume 9525, 952507 (2015) https://doi.org/10.1117/12.2184123

KEYWORDS: Distance measurement, Mirrors, Interferometry, Spectroscopy, Beam splitters, Spectral resolution, Light emitting diodes, Optical interferometry, Target detection, Ocean optics

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Proceedings Article | 1 May 2014 Paper

Metrology of undoped double-sided polished silicon wafer: surface, thickness and refractive index profile measurements

Ho-Jae Lee, Ki-Nam Joo

Proceedings Volume 9132, 91320W (2014) https://doi.org/10.1117/12.2051373

KEYWORDS: Semiconducting wafers, Silicon, Refractive index, Wafer-level optics, Interferometry, CCD cameras, Geometrical optics, Metrology, Polishing, Mirrors

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Proceedings Article | 11 August 2008 Paper

Surface metrology of silicon wafers using a femtosecond pulse laser

Taekmin Kwon, Ki-Nam Joo, Seung-Woo Kim

Proceedings Volume 7063, 706310 (2008) https://doi.org/10.1117/12.797040

KEYWORDS: Semiconducting wafers, Silicon, Femtosecond phenomena, Interferometry, Polishing, Mirrors, Semiconductor lasers, Pulsed laser operation, Inspection, Transmittance

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Proceedings Article | 14 August 2006 Paper

Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples

Ki-Nam Joo, Seung-Woo Kim

Proceedings Volume 6292, 62920N (2006) https://doi.org/10.1117/12.678461

KEYWORDS: Refractive index, Femtosecond phenomena, Interferometry, Distance measurement, Spectroscopy, Mirrors, Pulsed laser operation, Laser interferometry, Silica, Interferometers

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Proceedings Article | 27 August 2005 Paper

Absolute distance measurement using femtosecond laser

Seung-Woo Kim, Ki-Nam Joo, Jonghan Jin, Yun Seok Kim

Proceedings Volume 5858, 58580N (2005) https://doi.org/10.1117/12.612238

KEYWORDS: Femtosecond phenomena, Distance measurement, Interferometry, Heterodyning, Spectroscopy, Mirrors, Interferometers, Fabry–Perot interferometers, Mode locking, Pulsed laser operation

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Showing 5 of 12 publications

Conference Committee Involvement (2)

Optical Design and Testing XIV

13 October 2024 | Nantong, Jiangsu, China

Optical Design and Testing XIII

14 October 2023 | Beijing, China

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