Dr. Laurel K. Reilly-Raska
Post-doctoral research associate at Rensselaer Polytechnic Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 February 2008 Paper
Proceedings Volume 6850, 68500B (2008) https://doi.org/10.1117/12.763724
KEYWORDS: Error analysis, Inverse problems, Chemical elements, Sensors, Luminescence, Nickel, Neodymium, Discretization errors, Absorption, Diffuse optical tomography

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