Short throw interactive projection systems are widely used in education, training, commerce, and entertainment in
recent years. Different interactive techniques have been developed. And among them, the infrared location technique is
one of the attracting methods, because of the advantages such as independent of whiteboard and low cost, and so on.
However, the main defect is that the infrared pen point is easy to be blocked by user's hand.
In this paper, we introduced our recent progress on indirect measurement of the pen point used in a short throw
interactive projection system. Two infrared LEDs are fixed along the pen's body near the tail end. By separately
measuring the position of the two LEDs, the location of the front end pen point can be calculated. Such placement can
effectively avoid the LEDs from being blocked by user's hand. The mathematical model of this measurement scheme is
given separately in the situations of infinite focal length and short focal length of the camera. Errors are analyzed by both
analytical and numerical method. We used our position sensitive detector (PSD) based location system to test the effect
of this method.
The interactive projection systems have been widely used in people's life. Currently the major type is based on
interactive whiteboard (IWB). In recent years, a new type based on CCD/CMOS sensor is greatly developed. Compared
to IWB, CCD/CMOS implements non-contact sensing, which can use any surface as the projection screen. This makes
them more flexible in many applications. However, the main defect is that the location accuracy and tracing speed are
limited by the resolution and frame rate of the CCD/CMOS.
In this paper, we introduced our recent progress on constructing a new type of non-contact interactive projection
system by using a two-dimensional position sensitive detector (PSD). The PSD is an analog optoelectronic position
sensor utilizing photodiode surface resistance, which provides continuous position measuring and features high position
resolution (better than 1.5μm) and high speed response (less than 1μs). By using the PSD, both high positioning
resolution and high tracing speed can be easily achieved. A specially designed pen equipped with infrared LEDs is used
as a cooperative target. A high precision signal processing system is designed and optimized. The nonlinearity of the
PSD as well as the aberration of the camera lens is carefully measured and calibrated. Several anti-interference methods
and algorithms are studied. Experimental results show that the positioning error is about 2mm over a 1200mm×1000mm
projection screen, and the sampling rate is at least 100Hz.
Interactive projection systems based on CCD/CMOS have been greatly developed in recent years. They can locate and
trace the movement of a pen equipped with an infrared LED, and displays the user's handwriting or react to the user's
operation in real time. However, a major shortcoming is that the location device and the projector are independent with
each other, including both the optical system and the control system. This requires construction of two optical systems,
calibration of the differences between the projector view and the camera view, and also synchronization between two
control systems, etc.
In this paper, we introduced a two-dimensional location method based on digital micro-mirror device (DMD). The DMD
is used as the display device and the position detector in turn. By serially flipping the micro-mirrors on the DMD
according to a specially designed scheme and monitoring the reflected light energy, the image spot of the infrared LED
can be quickly located. By using this method, the same optical system as well as the DMD can be multiplexed for
projection and location, which will reduce the complexity and cost of the whole system. Furthermore, this method can
also achieve high positioning accuracy and sampling rates. The results of location experiments are given.
The design of a binocular visual system with long eye relief using the freeform profile is investigated in this paper. The
surface parameters of the original profile were calculated upon its geometrical structure specification, and the tangential
profile of the surface is described using the sample points. The astigmatism along the tangential plane can meet the
system requirement.
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