Long Chen
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 October 2021 Poster + Paper
Proceedings Volume 11896, 118960Q (2021) https://doi.org/10.1117/12.2600718
KEYWORDS: Particles, Shape analysis, Image analysis, Particle systems, Atmospheric particles, 3D metrology, Transmission electron microscopy, Scanning electron microscopy, Spherical lenses, Laser applications

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