Mr. Luis Agnaldo Gomes Perini Profile

Luis Agnaldo Gomes Perini

at CEA LETI

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Proceedings Article | 3 October 2016 Presentation + Paper

Towards laboratory x-ray nanotomography: instrumental improvements on a SEM-based system

L. A. Gomes Perini, P. Bleuet, B. Buijsse, L. F. Tz. Kwakman, W. Parker

Proceedings Volume 9967, 99671A (2016) https://doi.org/10.1117/12.2235993

KEYWORDS: X-rays, Tomography, Signal to noise ratio, Scanning electron microscopy, Electron beams, Nanowires, X-ray imaging, Sensors, X-ray detectors, Spatial resolution

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We aim at resolving deca-nanometer features in microelectronic samples using a laboratory SEM-based X-ray tomography microscope. Such a system produces X-rays through the interaction between a focused SEM electron beam and a metallic target. The effective source size of the X-ray beam can be adjusted by varying the target material and geometry. For instance, the use of tungsten nanowires (few hundred nanometers of length) combined with a high electron beam current leads to an increased X-ray flux generated in a reduced volume, necessary for detecting interface details of the analyzed object. It improves resolution and signal-to-noise ratio (SNR), but is also sensitive to electron beam-target instabilities during the scan. To improve robustness, a FFT-based image correlation is integrated in the process through a closed-loop control scheme. It allows stabilizing the electron beam on the target and to preserve the X-ray flux intensity and alignment. Also, a state of the art high-resolution scientific-CMOS (sCMOS) X-ray detector was installed, allowing to reduce noise and to increase quantum efficiency. Results show that such numerical and equipment improvements lead to significant gains in spatial resolution, SNR and scanning time of the SEM-based tomography. It paves the way to routine, high resolution, 3D X-ray imaging in the laboratory.

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