Dr. Majid Leonard Riaziat Profile

Dr. Majid Leonard Riaziat

President at OEpic Semiconductors Inc

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Publications (6)

Proceedings Article | 9 March 2020 Presentation

Progress in MHCG VCSELs (Conference Presentation)

Marcin Gebski, Majid Riaziat, Martin Zorn, James Lott, Tomasz Czyszanowski

Proceedings Volume 11300, 113000T (2020) https://doi.org/10.1117/12.2547328

KEYWORDS: Vertical cavity surface emitting lasers, Mirrors, Distributed Bragg reflectors, Modulation

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Proceedings Article | 24 February 2020 Paper

Comparison of 850 nm VCSEL oxide aperture designs

Niels Heermeier, Marcin Gębski, Nasibeh Haghighi, Philip Moser, Ping-Show Wong, Majid Riaziat, James Lott

Proceedings Volume 11300, 113000J (2020) https://doi.org/10.1117/12.2552196

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Optical resonators

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Proceedings Article | 4 March 2019 Presentation

Electrically-injected VCSELs incorporating monolithic high-index contrast grating mirrors (Conference Presentation)

Marcin Gebski, Majid Riaziat, Martin Zorn, James Lott, Tomasz Czyszanowski

Proceedings Volume 10938, 1093808 (2019) https://doi.org/10.1117/12.2508654

KEYWORDS: Vertical cavity surface emitting lasers, Mirrors, Gallium arsenide, LIDAR, Reflectivity, Ultraviolet radiation, Infrared radiation, Distributed Bragg reflectors, Free space, Facial recognition systems

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Proceedings Article | 28 February 2017 Paper

Reliability and manufacturability of 25G VCSELs with oxide apertures formed by in-situ monitoring

James Pao, Ta-Chung Wu, Wilson Kyi, Majid Riaziat, James Lott

Proceedings Volume 10115, 1011519 (2017) https://doi.org/10.1117/12.2253565

KEYWORDS: Oxidation, Vertical cavity surface emitting lasers, Reliability, Manufacturing, Oxides, Semiconducting wafers, Resistance, Process control, Atmospheric propagation, Semiconductors, Picosecond phenomena, Quantum wells, Oxygen

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Proceedings Article | 25 February 2017 Presentation + Paper

Tunnel junction 850-nm VCSEL for aperture uniformity and reliability

P. S. Wong, J. Yan, T. C. Wu, W. Kyi, J. Pao, M. Riaziat

Proceedings Volume 10122, 101220B (2017) https://doi.org/10.1117/12.2253053

KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Semiconductors, Gallium arsenide, Doping, Tellurium

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Showing 5 of 6 publications

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