Manish Taunk
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 October 2012 Paper
Manish Taunk, Subhash Chand
Proceedings Volume 8549, 854934 (2012) https://doi.org/10.1117/12.927360
KEYWORDS: Temperature metrology, Polymers, Semiconductors, Interfaces, Metals, Composites, Silver, Physics, Organic electronics, Oxidation

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