Dr. Maria Frade Rodriguez Profile

Dr. Maria Frade Rodriguez

PhD Student at Univ of Oxford

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 9 March 2016 Presentation + Paper

Deformable mirror based remote focusing for fast three-dimensional microscopy

Mantas Zurauskas, Maria Frade, Martin Booth

Proceedings Volume 9713, 971313 (2016) https://doi.org/10.1117/12.2212335

KEYWORDS: Wavefront sensors, Objectives, Phase retrieval, 3D image processing, Luminescence, Adaptive optics, Wavefronts, Two photon excitation microscopy, Deformable mirrors, Imaging systems, Mirrors, Microscopy

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Proceedings Article | 27 May 2011 Paper

Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer

María Frade, José María Enguita, Ignacio Álvarez, Silvia Rodríguez-Jiménez

Proceedings Volume 8082, 80821S (2011) https://doi.org/10.1117/12.889267

KEYWORDS: Fringe analysis, Wavefronts, Profilometers, Interferometry, Speckle, Defect detection, Crystals, Charge-coupled devices, Inspection, Calibration

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SPIE Journal Paper | 1 February 2010

Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applications

José Maria Enguita, Ignacio Álvarez, María Frade Rodriguez, Jorge Marina

OE, Vol. 49, Issue 02, 023602, (February 2010) https://doi.org/10.1117/12.10.1117/1.3321709

KEYWORDS: Interferometers, Precision measurement, Fourier transforms, Interferometry, Prototyping, Diffusers, Speckle, Optical engineering, Inspection, Fringe analysis

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Proceedings Article | 17 June 2009 Paper

Common-path two-wavelength interferometer with submicron precision for profile measurements in online applications

José Enguita, Ignacio Álvarez, María Frade, Jorge Marina

Proceedings Volume 7389, 73890W (2009) https://doi.org/10.1117/12.827502

KEYWORDS: Holography, Precision measurement, Fringe analysis, Speckle, Inspection, Diffusers, Interferometers, Prototyping, Fourier transforms, Interferometry

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Proceedings Article | 18 May 2009 Paper

Toward extended range sub-micron conoscopic holography profilometers using multiple wavelengths and phase measurement

José Enguita, Ignacio Álvarez, Jorge Marina, Guillermo Ojea, José Cancelas, María Frade

Proceedings Volume 7356, 735617 (2009) https://doi.org/10.1117/12.819456

KEYWORDS: Prototyping, Profilometers, Interferometry, Signal processing, Sensors, Inspection, Speckle, Fringe analysis, Holography, Crystals

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