Dr. Mathieu Morelle
at Katholieke Univ Leuven
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 September 2005 Paper
M. Morelle, L. Chibotaru, A. Ceulemans, C. Carballeira, V. Moshchalkov
Proceedings Volume 5932, 59321B (2005) https://doi.org/10.1117/12.623044
KEYWORDS: Magnetism, Resistance, Superconductors, Superconductivity, Scanning electron microscopy, Atomic force microscopy, Photomicroscopy, Aluminum, Phase measurement, Quantization

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