Dr. Michael A. Wayne
NRC Postdoctoral Fellow at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 23 April 2020 Presentation
Michael Wayne, Joshua Bienfang, Alan Migdall
Proceedings Volume 11386, 113860M (2020) https://doi.org/10.1117/12.2558722
KEYWORDS: Avalanche photodiodes, Single photon detectors, Silicon, Sensors, Picosecond phenomena, Interferometry

Proceedings Article | 4 March 2019 Presentation + Paper
Proceedings Volume 10933, 109330F (2019) https://doi.org/10.1117/12.2514855
KEYWORDS: Vertical cavity surface emitting lasers, Picosecond phenomena, Standards development, Optical amplifiers, Digital filtering, Process control, Feedback signals, Temperature metrology, Aluminum

Proceedings Article | 14 March 2018 Presentation
Sergey Polyakov, Michael Wayne, Joshua Bienfang
Proceedings Volume 10547, 105470P (2018) https://doi.org/10.1117/12.2287285
KEYWORDS: Sensors, Metrology, Single photon detectors, Error analysis, Statistical modeling, Statistical methods, Precision measurement, Correlation function, Calibration, Quantum electronics

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