Mr. MinHwan Seo Profile

MinHwan Seo

at SAMSUNG Electronics Co Ltd

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 5 June 2023 Presentation + Paper

Characterization of interface charge traps in PE-TEOS and HDP oxide with different annealing temperatures using time-dependent second-harmonic generation

Ingi Kim, Suhwan Park, Minhwan Seo, Sunhong Jun, Sungyoon Ryu, Sangwoo Bae, Namil Koo, Yusin Yang

Proceedings Volume 12569, 1256904 (2023) https://doi.org/10.1117/12.2657070

KEYWORDS: Oxides, Second harmonic generation, Interfaces, Annealing, Silicon, Electric fields, Electrical properties, Dielectrics, Silicon films, Wafer inspection

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Proceedings Article | 3 October 2022 Poster + Paper

Machine vision system for alignment in die-to-wafer bonder

Jiyoung Chu, Minhwan Seo, Hyungjin Kim, Wondon Joo, Sungmin Ahn, Sangwoo Bae

Proceedings Volume 12222, 122220L (2022) https://doi.org/10.1117/12.2633000

KEYWORDS: Semiconducting wafers, Optical alignment, Beam splitters, Distortion, Prisms, Wafer bonding, Machine vision, Cameras

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Proceedings Article | 21 August 2020 Presentation + Paper

Visible upconversion photoluminescence of bulk silicon and mesoscale silicon nanoparticles

Boris Afinogenov, Anton Medvedev, Ilya Antropov, Nikita Filatov, Anton Sofronov, Eunhee Jeang, Sangwoo Bae, Taehyun Kim, Ingi Kim, Akinori Ohkubo, Sangmin Lee, Seulgi Lee, Wondon Joo, Minhwan Seo, Aleksander Shorokhov, Vladimir Bessonov, Maksim Ryabko

Proceedings Volume 11467, 114670Y (2020) https://doi.org/10.1117/12.2570415

KEYWORDS: Nonlinear optics, Silicon, Luminescence, Nanoparticles, Semiconducting wafers, Upconversion, Doping, Visible radiation

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Proceedings Article | 20 August 2020 Poster + Paper

Beam transformation device using total internal reflection

Jiyoung Chu, Minhwan Seo, Sunghwi Cho, Woocheol Jeong, Hunyong Park, Sangwoo Bae, Wondon Joo

Proceedings Volume 11486, 114860K (2020) https://doi.org/10.1117/12.2567965

KEYWORDS: Beam shaping, Prisms, Reflection, Semiconductor lasers, Reflectivity, Mirrors, Beam propagation method, Optical simulations, Optical components

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Proceedings Article | 1 April 2020 Presentation + Paper

Single nanoparticle detection in the far field by nonlinear optical method

EunHee Jeang, Boris Afinogenov, Sangwoo Bae, TaeHyun Kim, Ingi Kim, Kyunghun Han, Akinori Ohkubo, SangMin Lee, MinHwan Seo, Seulgi Lee, Wondon Joo, Hosun Yoo, Anton Medvedev, Aleksandr Shorokhov, Anton Sofronov, Maksim Riabko, Vladimir Bessonov, Ilya Antropov

Proceedings Volume 11358, 1135802 (2020) https://doi.org/10.1117/12.2552708

KEYWORDS: Nanoparticles, Second-harmonic generation, Silicon, Particles, Polarization, Signal to noise ratio, Signal detection, Objectives, Semiconducting wafers, Microscopy

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