Mitsuo Takeda is Emeritus Fellow of Center for Optical Research and Education at Utsunomiya University, and Professor Emeritus of the University of Electro-Communications (UEC), Tokyo, Japan.
He received the BE degree in Electrical Engineering from UEC in 1969, and the ME and Ph.D. degrees in Applied Physics from the University of Tokyo, respectively, in 1971 and 1974.
After working for Canon Inc., he joined the faculty of UEC in 1977. He retired from UEC in 2012 and joined Utsunomiya University, from which he retired in 2021. During 1985 he was a visiting scholar of Prof. Joseph W. Goodman's Group at Stanford University, and in 2013-2014 a Humboldt Guest Professor at ITO University of Stuttgart, Germany.
His technical activities and interest include:
1) Optical metrology
2) Holography and optical information processing
3) Statistical optics and imaging theory
His service to technical community includes:
1) President/Executive Director of the Optical Society of Japan, JSAP, 2010.4-2012.3
2) Board of Directors of Japan Society of Applied Physics, 1993-1995
3) Board of Directors of Optical Society of Japan, 1996-1997
4) Board of Directors of SPIE 2003, 2007-2009.
5) Associate Editor of Optical Review, 1994-2003
6) Asian Editor of Journal of Holography and Speckle, 2004-present.
7) Member of the Editorial Board of Industrial Metrology 1990-1993, Optics and Lasers in Engineering 1999-present, Chinese Optics 2010-present, Journal of the European Optical Society RP 2013-present.
Honors and recognition:
Dennis Gabor Award (SPIE), Humboldt Research Award (Alexander von Humboldt Foundation), Emmett N. Leith Medal (OSA), Optics and Quantum Electronics Achievement Award (JSAP), Chandra S. Vikram Award (SPIE), Yoshizawa Award (JSPE), Distinguished Alumni Award (UEC)
SPIE Fellow, OSA Fellow, JSAP Fellow, a Member of International Order of Knights of Holography
He received the BE degree in Electrical Engineering from UEC in 1969, and the ME and Ph.D. degrees in Applied Physics from the University of Tokyo, respectively, in 1971 and 1974.
After working for Canon Inc., he joined the faculty of UEC in 1977. He retired from UEC in 2012 and joined Utsunomiya University, from which he retired in 2021. During 1985 he was a visiting scholar of Prof. Joseph W. Goodman's Group at Stanford University, and in 2013-2014 a Humboldt Guest Professor at ITO University of Stuttgart, Germany.
His technical activities and interest include:
1) Optical metrology
2) Holography and optical information processing
3) Statistical optics and imaging theory
His service to technical community includes:
1) President/Executive Director of the Optical Society of Japan, JSAP, 2010.4-2012.3
2) Board of Directors of Japan Society of Applied Physics, 1993-1995
3) Board of Directors of Optical Society of Japan, 1996-1997
4) Board of Directors of SPIE 2003, 2007-2009.
5) Associate Editor of Optical Review, 1994-2003
6) Asian Editor of Journal of Holography and Speckle, 2004-present.
7) Member of the Editorial Board of Industrial Metrology 1990-1993, Optics and Lasers in Engineering 1999-present, Chinese Optics 2010-present, Journal of the European Optical Society RP 2013-present.
Honors and recognition:
Dennis Gabor Award (SPIE), Humboldt Research Award (Alexander von Humboldt Foundation), Emmett N. Leith Medal (OSA), Optics and Quantum Electronics Achievement Award (JSAP), Chandra S. Vikram Award (SPIE), Yoshizawa Award (JSPE), Distinguished Alumni Award (UEC)
SPIE Fellow, OSA Fellow, JSAP Fellow, a Member of International Order of Knights of Holography
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The results are applicable for radiation in a broader spectrum including microwaves and gamma radiation.
Measurement of the orientation of the fast/slow axis and surface roughness for birefringent material
We propose a method for reducing artifactual phase errors inherent to the Fourier transform method (FTM) for fringe analysis. The phase obtained by the FTM is subject to ripple errors at the boundary edges of the fringe pattern where fringes become discontinuous. We note that these artifactual phase errors are found to have certain systematic relations to the form of the phase, amplitude, and background intensity distributions, which can be modeled by low-order polynomials, such as Zernike polynomials, in many cases of practical interest. Based on this observation, we estimate the systematic ripple errors by analyzing a virtual interferogram that is numerically created for a fringe model with known phase, amplitude, and background intensity distributions. Starting from a rough initial guess, the virtual interferogram is sequentially improved by an iterative algorithm, and the estimated errors are finally subtracted from the experimental data. We present the results of simulations and experiments that demonstrate the validity of the proposed method.
In this paper, we investigate the correlation tensor for stochastic electromagnetic fields modulated by a depolarizer consisting of a rough-surfaced retardation plate. Under the assumption that the microstructure of the scattering surface on the depolarizer is as fine as to be unresolvable in our observation region, we have derived a relationship between the polarization matrix/coherency matrix for the modulated electric fields behind the rough-surfaced retardation plate and the coherence matrix under the free space geometry. This relation is regarded as entirely analogous to the van Cittert-Zernike theorem of classical coherence theory. Within the paraxial approximation as represented by the ABCD-matrix formalism, the three-dimensional structure of the generated polarization speckle is investigated based on the correlation tensor, indicating a typical carrot structure with a much longer axial dimension than the extent in its transverse dimension.
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