Mr. Mykhaylo V. Ozerov Profile

Mykhaylo V. Ozerov

Student at National Taras Shevchenko Univ of Kyiv

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Proceedings Article | 20 October 2005 Paper

Azimuthal ellipsometry of subsurface layer stresses of specular metallic ribbons

L. Poperenko, M. Ozerov

Proceedings Volume 5965, 59651T (2005) https://doi.org/10.1117/12.625137

KEYWORDS: Iron, Chromium, Nickel, Molybdenum, Silicon, Dielectrics, Metals, Dielectric polarization, Ellipsometry, Magnesium

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Having determined the deviations of ellipsometrical parameters for light reflected from the ribbon surface as a function of its orientation in the ribbon plane, the level of internal strain changes in the subsurface layer of Fe-based (Fe₇₅Ni₄Mo₃Si₂B₁₆ and Fe₇₀Cr₁₅B₁₅ ) amorphous metal alloys has been analyzed. Optical measurements were carried out for as-casted ribbons at 12 (Fe₇₅Ni₄Mo₃Si₂B₁₆) and 4 (Fe₇₀Cr₁₅B₁₅ ) orientations of the ribbon longitudinal axis relatively to the plane of light incidence. For each orientation phase shift Δ between p- and s-components of the polarization vector and an azimuth Ψ of the restored linear polarization have been obtained using a LEF-3M reflectometer-goniometer. From the angular dependence Δ(φ) (φ is angle of light incidence), the principal angle φ₀ of light incidence was determined. Then, by rotating the sample around a normal to its surface within 360°, the polar diagrams (so-called indicatrices of ellipsometric parameters on rotation azimuth α) have been determined. The noncircular form of the polar diagram indicates a high sensitivity to internal stress variations arising during ribbon preparation. For Fe₇₀Cr₁₅B₁₅ ribbons the long-time irradiation even by comparatively small fluencies of neutrons, causes structural relaxation and essentially influences on optical properties in the IR. It was determined that in the IR a real part of the complex dielectric function ε₁>0 at any values φ angle of light incidence and α (azimuthal orientation of the ribbon longitudinal axis with respect to the light incidence plane).

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