Naoki To
at Yokohama National Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 December 2019 Paper
Proceedings Volume 11201, 112010A (2019) https://doi.org/10.1117/12.2541073
KEYWORDS: Mid-IR, Absorption, Metals, Scattering, FT-IR spectroscopy, Sensors, Lithography, Reflection, Finite-difference time-domain method, Infrared sensors

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