Prof. Natale J. Ianno Profile

Prof. Natale J. Ianno

Professor at Univ of Nebraska-Lincoln

SPIE Involvement:

Author

Publications (12)

Proceedings Article | 9 September 2014 Paper

Optical characterization of photofixed RTV effluent in an atomic oxygen atmosphere

J. Pu, N. Ianno

Proceedings Volume 9196, 91960G (2014) https://doi.org/10.1117/12.2060872

KEYWORDS: Adaptive optics, Oxygen, Atmospheric optics, Space operations, Optical properties, Vacuum ultraviolet, Spectroscopic ellipsometry, Refraction, Dielectrophoresis, Satellites

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Proceedings Article | 14 November 2013 Paper

Understanding the physical and material dynamics of multipulse femtosecond laser interactions with surfaces

Troy Anderson, Craig Zuhlke, Chris Wilson, Corey Kruse, Natale Ianno, Sidy Ndao, George Gogos, Dennis Alexander

Proceedings Volume 8885, 888518 (2013) https://doi.org/10.1117/12.2030319

KEYWORDS: Laser ablation, Laser induced damage, Femtosecond phenomena, Nickel, Pulsed laser operation, Statistical analysis, Laser applications, Laser processing, Scanning electron microscopy, Laser energy

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Proceedings Article | 29 May 2013 Paper

Fiber optic refractive index sensor based on π-phase shifted fiber Bragg grating fabricated on etched side-hole fiber

Qi Zhang, Lingling Hu, Jiajun Tian, Natale Ianno, Ming Han

Proceedings Volume 8722, 87220R (2013) https://doi.org/10.1117/12.2018265

KEYWORDS: Fiber Bragg gratings, Sensors, Etching, Refractive index, Fiber optics sensors, Polarization, Fiber optics, Spectral resolution, Temperature metrology, Birefringence

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Proceedings Article | 15 October 2012 Paper

Volatile contaminant materials: relationship between condensate, effluent and bulk composition

N. Ianno, J. Pu, F. Zhou

Proceedings Volume 8492, 84920C (2012) https://doi.org/10.1117/12.930497

KEYWORDS: FT-IR spectroscopy, Raman spectroscopy, Optical properties, Silicon, Ellipsometry, Adhesives, Spectroscopy, Silicon films, Field emission displays, Space operations

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Proceedings Article | 20 August 2010 Paper

Optical characterization of condensed RTV effluent as a function of temperature

N. Ianno, J. Pu, F. Zhou

Proceedings Volume 7794, 779402 (2010) https://doi.org/10.1117/12.859310

KEYWORDS: Space operations, Refraction, Ellipsometry, Data modeling, Crystals, Satellites, Spectroscopic ellipsometry, Reflection, Thin films, Solid modeling

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Proceedings Article | 2 September 2008 Paper

Optical characterization of condensed and photofixed RTV effluent

N. Ianno, D. Thompson

Proceedings Volume 7069, 706904 (2008) https://doi.org/10.1117/12.794815

KEYWORDS: Space operations, Ellipsometry, Refraction, Lamps, Silicon, Satellites, Spectroscopic ellipsometry, Reflection, Crystals, Refractive index

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Proceedings Article | 28 September 2007 Paper

Fabrication and applications of negative refractive index matermaterials with chiral properties

Ezekiel Bahar, N. Ianno

Proceedings Volume 6638, 66380H (2007) https://doi.org/10.1117/12.729628

KEYWORDS: Refractive index, Reflection, Interfaces, Matrices, Metamaterials, Magnetism, Free space, Refraction, Reflectors, Wave propagation

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SPIE Journal Paper | 1 April 2007

Complex media characterized by chirality and negative refractive index: analysis and applications

Ezekiel Bahar, Natale Ianno

JNP, Vol. 1, Issue 01, 013509, (April 2007) https://doi.org/10.1117/12.10.1117/1.2736677

KEYWORDS: Reflection, Matrices, Interfaces, Wave propagation, Refractive index, Free space, Radio propagation, Waveguides, Lenses, Electromagnetic radiation

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Proceedings Article | 10 December 2001 Paper

Recent developments in spectroscopic ellipsometry for in-situ applications

Blaine Johs, Jeff Hale, Natale Ianno, Craig Herzinger, Thomas Tiwald, John Woollam

Proceedings Volume 4449, (2001) https://doi.org/10.1117/12.450108

KEYWORDS: Data modeling, Oxides, Silicon, Calibration, Data acquisition, Sensors, Bandpass filters, In situ metrology, Semiconducting wafers, Birefringence

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Proceedings Article | 19 November 2001 Paper

Self-assembled neuromorphic networks

Supriyo Bandyopadhyay, Latika Menon, Nikolai Kouklin, Paul Williams, Natale Ianno

Proceedings Volume 4590, (2001) https://doi.org/10.1117/12.454616

KEYWORDS: Quantum communications, Semiconductors, Quantum dots, Gold, Aluminum, Nanostructures, Signal processing, Nanoelectronics, Logic, Ferromagnetics

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