There are manifold challenges in the measurement of photonic products with white light interferometry (WLI), especially where near- or inline measurement is needed. To face these challenges, new approaches in software and hardware are required. In this presentation, the use of a new white light interferometry sensor with advanced features and relevant unique capabilities is highlighted, with applications in the fields of optical and Photonics Integrated Circuit (PIC) development and production.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.