Neil W. Scanlan
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 January 2004 Paper
Proceedings Volume 5159, (2004) https://doi.org/10.1117/12.509858
KEYWORDS: Performance modeling, Fermium, Frequency modulation, Particle filters, Statistical modeling, Data modeling, Visual process modeling, Algorithm development, Volume rendering, Digital imaging

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