Dr. Neil W. Troy
Senior Systems Architect at KLA Corp
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 8 October 2020 Presentation + Paper
Proceedings Volume 11517, 115170U (2020) https://doi.org/10.1117/12.2572912
KEYWORDS: Reticles, Inspection, Wafer inspection, Wafer-level optics, Photomasks, Plasma, Semiconducting wafers, Signal to noise ratio, Algorithm development, Optics manufacturing

Proceedings Article | 9 March 2015 Paper
Proceedings Volume 9355, 935518 (2015) https://doi.org/10.1117/12.2077020
KEYWORDS: Glasses, Refractive index, Waveguides, Zinc, Microscopy, Near field optics, Near field, Raman spectroscopy, Aluminum, Molybdenum

Proceedings Article | 30 January 2012 Paper
Proceedings Volume 8247, 82470U (2012) https://doi.org/10.1117/12.910300
KEYWORDS: Glasses, Raman spectroscopy, Zinc, Femtosecond phenomena, Luminescence, Scanning electron microscopy, Ions, Confocal microscopy, Ytterbium, Waveguides

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