Dr. Nicola N. Kissoon
at ASML BVBA
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 April 2024 Presentation + Paper
D. Cerbu, V. Blanco Carballo, F. Schleicher, J. van de Kerkhove, P. Leray, N. Kissoon, E. De Poortere
Proceedings Volume 12955, 129551C (2024) https://doi.org/10.1117/12.3011142
KEYWORDS: Semiconducting wafers, Machine learning, Image processing, Design, Scanning electron microscopy

Proceedings Article | 28 April 2023 Presentation + Paper
Proceedings Volume 12494, 1249407 (2023) https://doi.org/10.1117/12.2658359
KEYWORDS: Extreme ultraviolet, Photoresist materials, Reflectometry, Extreme ultraviolet lithography, Optical constants, Interfaces

Proceedings Article | 12 October 2021 Poster + Presentation + Paper
Proceedings Volume 11854, 1185418 (2021) https://doi.org/10.1117/12.2600938
KEYWORDS: Etching, Logic, Critical dimension metrology, Inspection, Extreme ultraviolet lithography, Semiconducting wafers, Electron beam lithography, Optical lithography, Metrology, Diffractive optical elements

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