In this paper, we have considered the refractive index measurement resolution limits of a core-cladding intermodal fiber optic interferometer based on SMF-28 optical fiber, with spectral interrogation in the C-band. The resolution was calculated using the Cramer-Rao bound. To achieve this, we found the sensitivities of the cladding mode propagation constants to the refractive index of the surrounding medium, as well as the cladding mode attenuation coefficients, through full-vector numerical simulation. These calculations were performed for two fiber configurations: with and without a metal coating on the cladding. Our numerical results demonstrate that the refractive index measurement resolution improves when higher-order cladding modes are used. Also we demonstrated that the use of additional thin metal coating of the cladding and plasmon modes does not enhance the interferometric sensor's resolution in this case because their huge losses.
The paper develops an analytical apparatus to describe the resolution limits of optical fiber sensors, based on high-finesse Fabry-Perot interferometer, interrogated by means of spectral interferometry. The properties of interferometer spectral function, required for the analysis of resolution, are developed; in order to analyze the influence of noises on the resolution, Cramer-Rao formalism is utilized. An estimation of achievable resolution and optimal interferometer parameters in case of dominant photo detector noise is done.
In the current paper the influence of the metallic nanoparticles trapped by arabinogalactan (AG) molecule on the AG refractive index is studied. A convenient approach for refractive index measurement by means of wavelength-domain interferometry is proposed.
KEYWORDS: Interferometers, Signal to noise ratio, Interferometry, Interference (communication), Signal detection, Signal processing, Demodulation, Sensors, Photodetectors, Transform theory
An approach for measuring fast oscillations of an absolute value of interferometer optical path difference (OPD) has been developed. The principles of frequency-scanning interferometry are utilized for the registration of the interferometer spectral function from which the OPD is calculated. The proposed approach enables one to capture the absolute baseline variations at frequencies much higher than the spectral acquisition rate. Despite the conventional approaches associating a single baseline indication to the registered spectrum, in the proposed method, a specially developed demodulation procedure is applied to the spectrum. This provides the ability to capture the baseline variations that took place during the spectrum acquisition. An analytical model describing the limitations on the parameters of the possibly registered baseline variations is developed. The experimental verification of the proposed approach and the developed model has been performed.
An investigation of performance of multiplexed displacement sensors based on extrinsic Fabry-Perot interferometers has been carried out. We have considered serial and parallel configurations and analyzed the issues and advantages of the both. We have also extended the previously developed baseline demodulation algorithm for the case of a system of multiplexed sensors. Serial and parallel multiplexing schemes have been experimentally implemented with 3 and 4 sensing elements, respectively. For both configurations the achieved baseline standard deviations were between 30 and 200 pm, which is, to the best of our knowledge, more than an order less than any other multiplexed EFPI resolution ever reported.
A novel approach for extrinsic Fabry-Perot interferometer baseline measurement has been developed. The principles of frequency-scanning interferometry are utilized for registration of the interferometer spectral function, from which the baseline is demodulated. The proposed approach enables one to capture the absolute baseline variations at frequencies much higher than the spectral acquisition rate. Despite the conventional approaches, associating a single baseline indication to the registered spectrum, in the proposed method a modified frequency detection procedure is applied to the spectrum. This provides an ability to capture the baseline variations which took place during the spectrum acquisition. The limitations on the parameters of the possibly registered baseline variations are formulated. The experimental verification of the proposed approach for different perturbations has been performed.
Measurement of a wafer thickness is of a great value for fabrication and interrogation of MEMS/MOEMS devices, as well as conventional optical fiber sensors. In the current paper we investigate the abilities of the wavelength-scanning interferometry techniques for registering the baseline of an extrinsic fiber Fabry-Perot interferometer (EFPI) with the cavity formed by the two sides of a silicon plate. In order to enhance the resolution, an improved signal processing algorithm was developed. Various experiments, including contact and non-contact measurement of a silicon wafer thickness were performed, with the achieved resolutions from 10 to 20 pm. This enables one to use the described approach for high-precision measurement of geometric parameters of micro electro (electro-optic) mechanical systems for their characterization, utilization in sensing tasks and fabrication control. An ability of a Si plate-based EFPI interrogated by the developed technique to capture temperature variations of about 4 mK was demonstrated.
In the current article an advanced method of EFPI baseline measurement by use of spectral function
approximation is proposed. The method provides an increase in EFPI baseline measurement precision and computational
acceleration. The method bases on two foundations provided by analysis of low-finesse Fabry-Perot interferometer
model: reduction of search domain and taking into account the most informative spectral intervals, providing a greater
impact on the residual of measured and theoretical EFPI spectral functions. Proposed signal processing method resulted
in the EFPI baseline measurement resolution less than 50 pm for the cavity length values between 20 and 700 μm.
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