Mr. Norimitsu Wakama Profile

Norimitsu Wakama

Student at Nara Institute of Science and Technology

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Proceedings Article | 7 March 2014 Paper

On-chip polarizer on image sensor using advanced CMOS technology

Kiyotaka Sasagawa, Norimitsu Wakama, Toshihiko Noda, Takashi Tokuda, Kiyomi Kakiuchi, Jun Ohta

Proceedings Volume 8974, 89740I (2014) https://doi.org/10.1117/12.2040012

KEYWORDS: Polarizers, Metals, CMOS technology, Image sensors, Standards development, Photodiodes, Visible radiation, Optical testing, Refractive index, Near infrared

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The structures in advanced complementary metal-oxide-semiconductor (CMOS) integrated circuit technology are in the range of deep-submicron. It allows designing and integrating nano-photonic structures for the visible to near infrared region on a chip. In this work, we designed and fabricated an image sensor with on-pixel metal wire grid polarizers by using a 65-nm standard CMOS technology. It is known that the extinction ratio of a metal wire grid polarizer is increased with decrease in the grid pitch. With the metal wire layers of the 65-nm technology, the grid pitch sufficiently smaller than the wavelengths of visible light can be realized. The extinction ratio of approximately 20 dB has been successfully achieved at a wavelength of 750 nm. In the CMOS technologies, it is usual to include multiple metal layers. This feature is also useful to increase the extinction ratio of polarizers. We designed dual layer polarizers. Each layer partially reflects incident light. Thus, the layers form a cavity and its transmission spectrum depends on the layer position. The extinction ratio of 19.2 dB at 780 nm was achieved with the grid pitch greater than the single layer polarizer. The high extinction ratio is obtained only red to near infrared region because the fine metal layers of deepsubmicron standard CMOS process is usually composed of Cu. Thus, it should be applied for measurement or observation where wide spectrum is not required such as optical rotation measurement of optically active materials or electro-optic imaging of RF/THz wave.

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