We have investigated a numerical stability of transfer matrix
method for the calculations of transmission spectra in 1D photonic
structures based on ionic crystals. Transfer matrix method was
found to lead in appearance of some non-physical peaks in the
calculated transmission spectra for some values of the number of
layers.
Using transfer matrix method transmission spectra for the layered ordered structures of (Si/a - SiO2)m with
defect were investigated as in constant inductivity as with the account of dispersion of refraction index. It
was found that the account of the refraction index in silicon has a relatively weak effect on position of the
stop-bands in the considered photon-crystalline but considerably changes location and the value of peaks in the
transmission spectrum connected with the presence of defect in the structure. Moreover, the propagation of
electromagnetic waves through one-dimensional defect photon-crystalline structure was investigated by numeric
solution of Maxwell equations by the FDTD method. The cases of transmitted wave and spontaneous emission
were simulated. Localization of electrons and photons in the defect ordered structures were shown to be explicitly
different.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.