Dr. Pascal Mercère Profile

Dr. Pascal Mercère

at Synchrotron SOLEIL

SPIE Involvement:

Author

Proceedings Article | 26 September 2013 Paper

Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography

Kadda Medjoubi, Alain Bonissent, Nicolas Leclercq, Florent Langlois, Pascal Mercère, Andrea Somogyi

Proceedings Volume 8851, 88510P (2013) https://doi.org/10.1117/12.2026680

KEYWORDS: Tomography, Sensors, Absorption, X-ray fluorescence spectroscopy, Copper, Data acquisition, Silicon, X-rays, Hard x-rays, Phase contrast

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Proceedings Article | 26 September 2013 Paper

High efficiency x-ray nanofocusing by the blazed stacking of binary zone plates

I. Mohacsi, P. Karvinen, I. Vartiainen, A. Diaz, A. Somogyi, C. Kewish, P. Mercere, C. David

Proceedings Volume 8851, 88510Z (2013) https://doi.org/10.1117/12.2022640

KEYWORDS: Zone plates, Diffraction, Binary data, Optical alignment, Phase shifts, X-rays, Lenses, Scanning electron microscopy, Near field optics, Actuators

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Proceedings Article | 29 September 2010 Paper

Hartmann wavefront sensor and adaptive x-ray optics developments for synchrotron applications

Pascal Mercère, Mourad Idir, Guillaume Dovillaire, Xavier Levecq, Samuel Bucourt, Lionnel Escolano, Paul Sauvageot

Proceedings Volume 7803, 780302 (2010) https://doi.org/10.1117/12.860990

KEYWORDS: Mirrors, Actuators, X-rays, Deformable mirrors, Wavefront sensors, X-ray optics, Wavefronts, Photovoltaics, Synchrotron radiation, Metrology

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Proceedings Article | 29 September 2009 Paper

Perspective for high energy density studies on x-ray FELs

R. Lee, B. Nagler, U. Zastrau, R. Fäustlin, S. Vinko, T. Whitcher, R. Sobierajski, J. Krzywinski, L. Juha, A. Nelson, S. Bajt, K. Budil, R. Cauble, T. Bornath, T. Burian, J. Chalupsky, H. Chapman, J. Cihelka, T. Döppner, T. Dzelzainis, S. Düsterer, M. Fajardo, E. Förster, C. Fortmann, S. Glenzer, S. Göde, G. Gregori, V. Hajkova, P. Heimann, M. Jurek, F. Khattak, A. Khorsand, D. Klinger, M. Kozlova, T. Laarmann, H.-J. Lee, K.-H. Meiwes-Broer, P. Mercere, W. Murphy, A. Przystawik, R. Redmer, H. Reinholz, D. Riley, G. Röpke, K. Saksl, R. Thiele, J. Tiggesbäumker, S. Toleikis, T. Tschentscher, I. Uschmann, R. Falcone, R. Shepherd, J. Hastings, W. White, J. Wark

Proceedings Volume 7451, 74510E (2009) https://doi.org/10.1117/12.825349

KEYWORDS: Free electron lasers, X-rays, Extreme ultraviolet, Electrons, Absorption, Luminescence, Liquid crystal lasers, Photons, Fusion energy, Chemical species

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Proceedings Article | 18 June 2007 Paper

Surface metrology with a stitching Shack-Hartmann profilometric head

J. Floriot, X. Levecq, S. Bucourt, M. Thomasset, F. Polack, M. Idir, P. Mercère, S. Brochet, T. Moreno

Proceedings Volume 6616, 66162A (2007) https://doi.org/10.1117/12.726058

KEYWORDS: Wavefront sensors, Mirrors, Head, Wavefronts, Spherical lenses, Metrology, Calibration, Microlens, Synchrotrons, Surface finishing

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Proceedings Article | 17 September 2005 Paper

X-ray beam metrology and X-ray optic alignment by Hartmann wavefront sensing

Pascal Mercere, Samuel Bucourt, Gilles Cauchon, Denis Douillet, Guillaume Dovillaire, Kenneth Goldberg, Mourad Idir, Xavier Levecq, Thierry Moreno, Patrick Naulleau, Senajith Rekawa, Philippe Zeitoun

Proceedings Volume 5921, 592109 (2005) https://doi.org/10.1117/12.622799

KEYWORDS: Extreme ultraviolet, Sensors, Imaging systems, Mirrors, X-rays, Hard x-rays, X-ray optics, Calibration, Active optics, Wavefront sensors

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Proceedings Article | 19 December 2003 Paper

New techniques for the measurement of x-ray beam or x-ray optics quality

Philippe Zeitoun, Philippe Balcou, Samuel Bucourt, Djamel Benredjem, Franck Delmotte, Guillaume Dovillaire, Denis Douillet, James Dunn, G. Faivre, Marta Fajardo, Kenneth Goldberg, Mourad Idir, Sebastien Hubert, Jim Hunter, Sylvie Jacquemot, Sophie Kazamias, Sebastien le Pape, Xavier Levecq, Ciaran Lewis, Remy Marmoret, Pascal Mercere, A. Morlens, Patrick Naulleau, Christian Remond, Jorge Rocca, Stephane Sebban, Raymond Smith, Marie-Francoise Ravet, Philippe Troussel, Constance Valentin, Laurent Vanbostal

Proceedings Volume 5197, (2003) https://doi.org/10.1117/12.508183

KEYWORDS: Wavefronts, X-ray lasers, Wavefront sensors, Extreme ultraviolet, Plasma, Mirrors, Interferometers, Picosecond phenomena, Michelson interferometers, X-ray optics

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Showing 5 of 7 publications

Conference Committee Involvement (2)

Adaptive X-Ray Optics IV

28 August 2016 | San Diego, California, United States

Adaptive X-Ray Optics III

17 August 2014 | San Diego, California, United States

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