Peter D. Fuqua
at Aerospace Corp
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 24 August 2021 Presentation + Paper
Frank Pan, Peter Fuqua, Yong Kim, James Barrie
Proceedings Volume 11820, 118200K (2021) https://doi.org/10.1117/12.2593675
KEYWORDS: Interfaces, Acoustics, Silicon, Microscopy, Annealing, Reflection, Reflectivity, Capillaries, Wafer bonding, Ultrasonic non-destructive evaluation

Proceedings Article | 15 October 2012 Paper
P. Fuqua, C. Panetta, J. Barrie, E. Waluschka, T. Mooney
Proceedings Volume 8510, 851009 (2012) https://doi.org/10.1117/12.945964
KEYWORDS: Near infrared, Optical filters, Light scattering, Sensors, Surface plasmons, Integrating spheres, Polarization, Bandpass filters, Landsat, Earth observing sensors

Proceedings Article | 15 October 2012 Paper
J. Barrie, P. Fuqua, M. Meshishnek, M. Ciofalo, C. Chu, J. Chaney, R. Moision, L. Graziani
Proceedings Volume 8510, 85101B (2012) https://doi.org/10.1117/12.933276
KEYWORDS: Mirrors, Ultraviolet radiation, Reflectivity, Tungsten, Oxides, Space telescopes, Telescopes, Contamination, Aerospace engineering, Sensors

Proceedings Article | 22 September 2011 Paper
C. Panetta, P. Fuqua, C.-T. Chu, J. Barrie
Proceedings Volume 8128, 81280D (2011) https://doi.org/10.1117/12.893656
KEYWORDS: Humidity, Water, Absorption, Nitrogen, Antireflective coatings, Infrared radiation, Optical coatings, Infrared coatings, Optical components, Reflection

Proceedings Article | 30 May 2003 Paper
Peter Fuqua, Nathan Presser, James Barrie, Michael Meshishnek, Dianne Coleman
Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.474853
KEYWORDS: Coating, Dielectrics, Dielectric filters, Multilayers, Particles, Laser induced damage, Silicon, Scanning electron microscopy, Plasma, Photomicroscopy

Showing 5 of 11 publications
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