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Peter Heiland
President at Integrated Dynamics Engineering Inc
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 29 August 2005 Paper
Generic vibration criteria for nanotechnology experiments
A. Michael Fraumeni, Peter Heiland, Neil Judell
Proceedings Volume 5933, 59330T (2005) https://doi.org/10.1117/12.619404
KEYWORDS: Nanotechnology, Acoustics, Scanning probe lithography, Sensors, Motion models, Virtual colonoscopy, Scanning probe microscopy, Buildings, Semiconductors, Environmental sensing
Conference Committee Involvement (1)
Current Developments in Vibration Control for Optomechanical Systems
20 July 1999 | Denver, CO, United States
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