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Philipp Heidingsfelder
at Hochschule Heilbronn
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Publications (2)
SPIE Journal Paper | 27 June 2014
Subpixel edge localization with reduced uncertainty by violating the Nyquist criterion
Philipp Heidingsfelder, Jun Gao, Kun Wang, Peter Ott
OE, Vol. 53, Issue 12, 122410, (June 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.12.122410
KEYWORDS: Error analysis, Sensors, Electrons, Signal to noise ratio, Spatial frequencies, Optical engineering, Microscopes, Edge detection, Solids, Computer simulations
SPIE Journal Paper | 4 October 2012
Theoretical analysis of photon noise limiting axial depth resolution for three-dimensional microscopy by incoherent structured illumination
Philipp Heidingsfelder, Jun Gao, Peter Ott
OE, Vol. 51, Issue 10, 103203, (October 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.10.103203
KEYWORDS: Spatial frequencies, Fringe analysis, Microscopes, Error analysis, Signal to noise ratio, Charge-coupled devices, Microscopy, Optical engineering, Statistical analysis, Confocal microscopy
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