Dr. Pierre Barritault Profile

Dr. Pierre Barritault

Retired at CEA-LETI

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Author

Publications (16)

Proceedings Article | 5 March 2022 Presentation + Paper

Room temperature spectral characterization of direct band gap Ge0.85Sn0.15 LEDs and photodiodes

C. Cardoux, L. Casiez, N. Pauc, V. Calvo, N. Coudurier, P. Rodriguez, J. Richy, P. Barritault, O. Lartigue, C. Constancias, M. Frauenrath, J.M. Hartmann, A. Chelnokov, O. Gravrand, V. Reboud

Proceedings Volume 12006, 120060A (2022) https://doi.org/10.1117/12.2608964

KEYWORDS: Light emitting diodes, Sensors, Germanium, Calibration, Silicon, FT-IR spectroscopy, Spectral calibration, Tin, Photodiodes

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Proceedings Article | 3 March 2022 Poster

Miniaturized 3D monolithic optical system for particles’ sensor 'on-a-chip'

Andrea Lovera, Gabriel Jobert, Pierre Barritault, Maryse Fournier, Cyrielle Monpeurt, Pietro Bernasconi, Daniele Braga

Proceedings Volume PC11974, PC119740E (2022) https://doi.org/10.1117/12.2608489

KEYWORDS: Particles, Sensors, Optical components, Surface finishing, Optics manufacturing, Scattering, Retina, Polishing, Chemical elements, Wet etching

Proceedings Article | 2 March 2020 Paper

A miniaturized optical sensor for particulate matter detection

Maryse Fournier, Pierre Barritault, Gabriel Jobert, Adrien Marchant, Salim Boutami, Julien Michelot, Pierre Lienhard, Sergio Nicoletti, Laurent Duraffourg

Proceedings Volume 11287, 1128717 (2020) https://doi.org/10.1117/12.2546128

KEYWORDS: Particles, Light scattering, Sensors, Scattering, Imaging systems, Semiconducting wafers, Photodiodes, Refractive index, Laser scattering, Optical sensors

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Proceedings Article | 9 September 2019 Paper

Visible to mid-infrared integrated sensors for air quality measurement

S. Boutami, G. Jobert, P. Barritault, J. G. Coutard, M. Fournier, J. M. Fédéli, P. Labeye, A. Marchant, J. Skubich, A. Teulle, O. Lartigue, E. Lorent, A. Glière, C. Constancias, S. Nicoletti, C. Jamois, C. Seassal, L. Duraffourg

Proceedings Volume 11088, 110880R (2019) https://doi.org/10.1117/12.2529262

KEYWORDS: Sensors, Silicon, Particles, Mid-IR, Quantum cascade lasers, Photoacoustic spectroscopy, Scattering, Absorption, Light scattering, Acoustics

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Proceedings Article | 4 March 2019 Presentation + Paper

Miniaturization of mid-IR sensors on Si: challenges and perspectives

Sergio Nicoletti, Jean-Marc Fédéli, Maryse Fournier, Pierre Labeye, Pierre Barritault, Adrien Marchant, Alain Glière, Alexandre Teulle, Jean-Guillaume Coutard, Laurent Duraffourg

Proceedings Volume 10923, 109230H (2019) https://doi.org/10.1117/12.2506759

KEYWORDS: Silicon, Mid-IR, Sensors, Quantum cascade lasers, Photonic integrated circuits, Waveguides, Semiconducting wafers, Microelectromechanical systems, Absorption, Cladding

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Proceedings Article | 16 February 2017 Paper

Multiplexing photonic devices integrated on a silicon/germanium platform for the mid-infrared

P. Labeye, A. Koshkinbayeva, M. Dupoy, P. Barritault, O. Lartigue, M. Fournier, J.-M. Fedeli, S. Boutami, S. Garcia, S. Nicoletti, L. Duraffourg

Proceedings Volume 10106, 101060Y (2017) https://doi.org/10.1117/12.2256224

KEYWORDS: Silicon, Waveguides, Mid-IR, Gas sensors, Atmospheric sensing, Multiplexing, Photonic devices, Photodetectors, Germanium, Silicon photonics, Quantum cascade lasers, Multiplexers, Carbon monoxide, Gas lasers, Sensors

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Proceedings Article | 1 December 2008 Paper

Accurate dimensional characterization of periodic structures by spectroscopic Mueller polarimetry

M. Foldyna, A. De Martino, D. Cattelan, F. Bogeat, C. Licitra, J. Foucher, P. Barritault, J. Hazart

Proceedings Volume 7140, 71400I (2008) https://doi.org/10.1117/12.804682

KEYWORDS: Atomic force microscopy, Data modeling, Critical dimension metrology, Polarimetry, Diffraction gratings, Silicon, Spectroscopy, 3D metrology, Scatterometry, Error analysis

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Proceedings Article | 16 April 2008 Paper

Comparison of spectroscopic Mueller polarimetry, standard scatterometry, and real space imaging techniques (SEM and 3D-AFM) for dimensional characterization of periodic structures

A. De Martino, M. Foldyna, T. Novikova, D. Cattelan, P. Barritault, C. Licitra, J. Hazart, J. Foucher, F. Bogeat

Proceedings Volume 6922, 69221P (2008) https://doi.org/10.1117/12.772721

KEYWORDS: Atomic force microscopy, Data modeling, Polarimetry, Critical dimension metrology, Diffraction gratings, 3D metrology, Spectroscopic ellipsometry, Silicon, Spectroscopy, 3D imaging standards

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Proceedings Article | 5 April 2007 Paper

Robust sub-50-nm CD control by a fast-goniometric scatterometry technique

Jérôme Hazart, Pierre Barritault, Stéphanie Garcia, Thierry Leroux, Pierre Boher, Koichi Tsujino

Proceedings Volume 6518, 65183A (2007) https://doi.org/10.1117/12.712844

KEYWORDS: Critical dimension metrology, Ellipsometry, Scatterometry, Refractive index, Reflectivity, Silicon, Metrology, Polarizers, Error analysis, Statistical analysis

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Proceedings Article | 10 May 2005 Paper

Improved CD and overlay metrology using an optical Fourier transform instrument

J. Petit, P. Boher, T. Leroux, P. Barritault, J. Hazart, P. Chaton

Proceedings Volume 5752, (2005) https://doi.org/10.1117/12.599464

KEYWORDS: Overlay metrology, Diffraction gratings, Diffraction, Fourier transforms, Reflectivity, Double patterning technology, Scattering, Fourier optics, Silicon, Spectroscopic ellipsometry

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Proceedings Article | 21 February 2005 Paper

Fluorescence of mitigated laser damage in fused silica

Pierre Barritault, Philippe Bouchut, Herve Bercegol, Patrick Chaton, Guillaume Ravel

Proceedings Volume 5647, (2005) https://doi.org/10.1117/12.585045

KEYWORDS: Luminescence, Silica, Laser induced damage, Cartography, Spectroscopy, Gas lasers, Carbon monoxide, Optical components, Absorption, Fluorescence spectroscopy

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Proceedings Article | 24 May 2004 Paper

A new analysis strategy for CD metrology using rapid photo goniometry method

Jerome Petit, Pierre Barritault, Jerome Hazart, Patrick Chaton, Pierre Boher, Mathieu Luet, Thierry Leroux

Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.533031

KEYWORDS: Diffraction gratings, Diffraction, Scanning electron microscopy, Critical dimension metrology, Spectroscopic ellipsometry, Polarizers, Specular reflections, Photoresist materials, CCD image sensors, Sensors

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Proceedings Article | 24 May 2004 Paper

Innovative rapid photogoniometry method for CD metrology

Pierre Boher, Mathieu Luet, Thierry Leroux, Jerome Petit, Pierre Barritault, Jerome Hazart, Patrick Chaton

Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.533426

KEYWORDS: Diffraction, Diffraction gratings, Fourier optics, Reflection, Polarization, Spectroscopic ellipsometry, CCD image sensors, Refractive index, Silicon, Sensors

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Proceedings Article | 25 February 2004 Paper

Optical thin films serving biotechnology: fluorescence enhancement of DNA chip

Pierre Barritault, Stephane Getin, Patrick Chaton, Bernard Andre, Francoise Vinet, Brigitte Fouque

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.516261

KEYWORDS: Luminescence, Polarization, Microscopes, Thin films, Glasses, Absorption, Silicon, Silica, Fluorescence spectroscopy, Objectives

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Proceedings Article | 21 June 2002 Paper

Polarized gonio fluorimetric measurements of DNA-chip: a step forward towards fluorescence quantification

Pierre Barritault, Stephane Getin, Patrick Chaton, Francoise Vinet, Brigitte Fouque, Jean-Louis Stehle

Proceedings Volume 4626, (2002) https://doi.org/10.1117/12.472090

KEYWORDS: Luminescence, Microscopes, Polarization, Signal detection, Solids, Molecules, Electromagnetic coupling, Polarizers, Silica, Fluorescence spectroscopy

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Proceedings Article | 17 June 1999 Paper

Scanning apertureless fluorescence microscope

Guillaume Lessard, T. Jason Yang, Pierre Barritault, Stephen Quake

Proceedings Volume 3607, (1999) https://doi.org/10.1117/12.350630

KEYWORDS: Atomic force microscopy, Luminescence, Near field, Photons, Near field optics, Near field scanning optical microscopy, Microscopes, Photodetectors, Optical amplifiers, Sensors

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Showing 5 of 16 publications

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