Prof. Pierre R. Slangen
Head of Applied Optics Lab: ONIVOA at EuroMov DHM IMT Mines Ales
SPIE Involvement:
Author
Publications (24)

Proceedings Article | 20 June 2021 Presentation + Paper
Ahmed Boukar, Patrick Ienny, Stephane Corn, Pierre Slangen
Proceedings Volume 11782, 117820B (2021) https://doi.org/10.1117/12.2593708
KEYWORDS: Digital image correlation, Composites, High speed imaging, Sensors, Mechanics, Manufacturing, Image storage, Applied sciences, Solids, Photography

Proceedings Article | 20 June 2021 Presentation + Paper
Proceedings Volume 11785, 117850G (2021) https://doi.org/10.1117/12.2593283

Proceedings Article | 21 June 2019 Presentation + Paper
Pascal Picart, Michel Fages, Pierre Slangen, Haiting Xia, Silvio Montresor, Rongxin Guo, Junchang Li, O. Yusuf Solieman, Jean-Cédric Durand
Proceedings Volume 11060, 110600B (2019) https://doi.org/10.1117/12.2531773
KEYWORDS: Teeth, Digital holography, Ceramics, 3D metrology, Holography, Fringe analysis, Deflectometry, Speckle interferometry, Interferometry, Digital photography

Proceedings Article | 21 June 2019 Presentation + Paper
Proceedings Volume 11059, 110590Z (2019) https://doi.org/10.1117/12.2526120
KEYWORDS: Video, Detection and tracking algorithms, Image processing

Proceedings Article | 21 June 2019 Paper
Proceedings Volume 11059, 1105907 (2019) https://doi.org/10.1117/12.2525977
KEYWORDS: Digital holography, Liquids, Holography, Bioalcohols, Particles, Sensors, Cameras, High speed imaging, Time metrology, Optical design

Showing 5 of 24 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 13 September 2006

Conference Committee Involvement (12)
Multimodal Sensing and Artificial Intelligence: Technologies and Applications III
27 June 2023 | Munich, Germany
Multimodal Sensing and Artificial Intelligence: Technologies and Applications II
21 June 2021 | Online Only, Germany
Multimodal Sensing and Artificial Intelligence: Technologies and Applications
26 June 2019 | Munich, Germany
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Showing 5 of 12 Conference Committees
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