Total variation(TV) based on regularization has been proven as a popular and effective model for image restoration, because of its ability of edge preserved. However, as the TV favors a piece-wise constant solution, the processing results in the flat regions of the image are easily produced "staircase effects", and the amplitude of the edges will be underestimated; the underlying cause of the problem is that the regularization parameter can not be changeable with spatial local information of image. In this paper, we propose a novel Scatter-matrix eigenvalues-based TV(SMETV) regularization with image blind restoration algorithm for deblurring medical images. The spatial information in different image regions is incorporated into regularization by using the edge indicator called difference eigenvalue to distinguish edges from flat areas. The proposed algorithm can effectively reduce the noise in flat regions as well as preserve the edge and detailed information. Moreover, it becomes more robust with the change of the regularization parameter. Extensive experiments demonstrate that the proposed approach produces results superior to most methods in both visual image quality and quantitative measures.
White light interference (WLI) optical profiler had been used widely for structured surface measurement. To achieve high measuring accuracy, piezoelectric ceramic (PZT) was usually used as the vertical scanning unit, which was normally less than 100um and only for small range structured surface measurement. With the development of advanced manufacturing technology, precision structured surfaces with large step height were appearing. To satisfy the measurement requirements of this kind of precision structured surfaces, WLI optical profiler with large range had to be developed. In this paper, an optical profiler was proposed, in which a coarse-fine vertical scanning system was adopted to expand its measurement range to 10mm while its resolution still at nanometer level.
Piezoelectric ceramics with a flexible hinge guide was used for fine positioning at nanometer level, while a stepping motor was used for coarse positioning with a resolution at micrometer level, and their combination helped fulfillment of vertical scanning positioning with large range and nanometer resolution. A grating sensor was used for the real-time measurement of scanning displacement for close-loop positioning control. The properties of the flexible hinge guide was analyzed using ANSYS. Experimental results indicated the performance of the system was good. The system had a good application prospect in an optical profiler for surface measurement.
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