Raghu Kokku
Research Scientist at GE Research
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 June 2005 Paper
Raghu Kokku, Glen Brooksby
Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612243
KEYWORDS: 3D metrology, Feature extraction, Light scattering, Laser scattering, 3D image processing, 3D modeling, Inspection, Sensors, Speckle, Scattering

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