Dr. Raymond P. Conley
X-Ray Optics Scientist at Argonne National Lab
SPIE Involvement:
Author
Publications (21)

Proceedings Article | 2 November 2023 Poster + Paper
Yujia Ding, Raymond Conley, Carlo Segre, Bing Shi, Jeff Terry, Ali Khounsary
Proceedings Volume PC12694, PC126940A (2023) https://doi.org/10.1117/12.2682020
KEYWORDS: Coating, Mirrors, Platinum, Absorption, X-rays, Silicon, Reflection, Aluminum, Rhodium, Multilayers

Proceedings Article | 3 October 2023 Presentation + Paper
Proceedings Volume 12653, 126530D (2023) https://doi.org/10.1117/12.2677690
KEYWORDS: Polishing, Fabrication, Multilayers, Surface finishing, Diamond, Hard x-rays, X-ray optics, X-rays

Proceedings Article | 17 September 2018 Paper
Ali Khounsary, Raymond Conley, Albert Macrander, Reno Waswil, Thomas Irving, Carlo Segre
Proceedings Volume 10760, 107600J (2018) https://doi.org/10.1117/12.2324824
KEYWORDS: Multilayers, Reflectivity, Monochromators, Silicon, Optical coatings, X-rays, Crystals, Diffraction

Proceedings Article | 7 September 2017 Presentation + Paper
Proceedings Volume 10389, 1038909 (2017) https://doi.org/10.1117/12.2272842
KEYWORDS: Gold, Zone plates, Image transmission, X-rays, Phase shifts, Monochromators, Charge-coupled devices, X-ray optics, Interfaces, Sputter deposition

Proceedings Article | 28 March 2017 Presentation + Paper
S. Babin, N. Bouet, S. Cabrini, G. Calafiore, R. Conley, G. Gevorkyan, K. Munechika, A. Vladár, V. Yashchuk
Proceedings Volume 10145, 1014518 (2017) https://doi.org/10.1117/12.2257624
KEYWORDS: Metrology, Imaging systems, Contrast transfer function, Software development, Scanning electron microscopy, Semiconductors, Silicon, Diffraction, Spatial frequencies, Transmission electron microscopy, Optical fabrication, Fabrication

Proceedings Article | 4 September 2015 Paper
Proceedings Volume 9603, 96031H (2015) https://doi.org/10.1117/12.2188135
KEYWORDS: Mirrors, Ions, Multilayers, Metrology, X-ray telescopes, Glasses, X-rays, Computer aided design, X-ray astronomy, Sputter deposition

Proceedings Article | 5 September 2014 Paper
Ray Conley, Bing Shi, Mark Erdmann, Scott Izzo, Lahsen Assoufid, Kurt Goetze, Tim Mooney, Kenneth Lauer
Proceedings Volume 9207, 92070I (2014) https://doi.org/10.1117/12.2062427
KEYWORDS: Multilayers, Mirrors, Coating, Ions, Sputter deposition, Metrology, Ion beams, X-ray optics, Servomechanisms, Monochromators

Proceedings Article | 5 September 2014 Paper
Proceedings Volume 9207, 920708 (2014) https://doi.org/10.1117/12.2061869
KEYWORDS: Multilayers, Silicon, Thin films, Molybdenum, Sputter deposition, Hard x-rays, X-ray optics, Lenses, Thin film devices, Interfaces

Proceedings Article | 19 October 2012 Paper
Ray Conley, Nathalie Bouet, Juan Zhou, Hanfei Yan, Yong Chu, Kenneth Lauer, Jesse Miller, Luke Chu, Nima Jahedi
Proceedings Volume 8502, 850202 (2012) https://doi.org/10.1117/12.930216
KEYWORDS: Multilayers, Sputter deposition, Nitrogen, Scanning electron microscopy, Silicon, Reflectivity, X-ray optics, X-rays, Metrology, Control systems

SPIE Journal Paper | 1 September 2011 Open Access
OE, Vol. 50, Issue 09, 093604, (September 2011) https://doi.org/10.1117/12.10.1117/1.3622485
KEYWORDS: Modulation transfer functions, Calibration, Transmission electron microscopy, Scanning electron microscopy, Electron microscopes, Binary data, Interferometers, Profilometers, Spatial frequencies, Microscopes

Proceedings Article | 29 September 2010 Paper
Proceedings Volume 7802, 780203 (2010) https://doi.org/10.1117/12.865306
KEYWORDS: Etching, Reactive ion etching, Silicon, Chemistry, Anisotropic etching, Plasma etching, Ions, Plasma, X-ray optics, Zone plates

Proceedings Article | 2 September 2010 Paper
Proceedings Volume 7801, 78010B (2010) https://doi.org/10.1117/12.860049
KEYWORDS: Modulation transfer functions, Transmission electron microscopy, Scanning electron microscopy, Calibration, Binary data, Interferometers, Electron microscopes, Silicon, Spatial frequencies, Interferometry

Proceedings Article | 27 August 2010 Paper
Proceedings Volume 7802, 78020G (2010) https://doi.org/10.1117/12.861044
KEYWORDS: Mirrors, Coating, Platinum, X-ray optics, Silicon, Metrology, Spherical lenses, X-rays, Hard x-rays, Sputter deposition

Proceedings Article | 9 September 2009 Paper
Ray Conley, Nathalie Bouet, James Biancarosa, Qun Shen, Larry Boas, John Feraca, Leonard Rosenbaum
Proceedings Volume 7448, 74480U (2009) https://doi.org/10.1117/12.842076
KEYWORDS: Multilayers, Coating, X-ray optics, Magnetism, Control systems, Plasma, Gold, X-rays, Silicon, Thin films

Proceedings Article | 1 October 2007 Paper
Proceedings Volume 6704, 670406 (2007) https://doi.org/10.1117/12.736384
KEYWORDS: Mirrors, Interferometers, Objectives, Microscopes, X-rays, Hard x-rays, Interferometry, X-ray optics, Metrology, Coating

Proceedings Article | 20 September 2007 Paper
Proceedings Volume 6705, 670505 (2007) https://doi.org/10.1117/12.736024
KEYWORDS: Reflectivity, Sputter deposition, Multilayers, Silicon, X-rays, X-ray optics, Aluminum, Reflection, Process control, Thin films

Proceedings Article | 29 August 2006 Paper
Proceedings Volume 6317, 63170J (2006) https://doi.org/10.1117/12.687074
KEYWORDS: Silicon, Multilayers, Chemical species, Molybdenum, Thin films, Semiconducting wafers, Interfaces, Polishing, Chromium, X-rays

Proceedings Article | 4 November 2004 Paper
Proceedings Volume 5539, (2004) https://doi.org/10.1117/12.560046
KEYWORDS: Zone plates, Diffraction, X-ray optics, Point spread functions, X-rays, Optics manufacturing, Diffraction gratings, Modulation transfer functions, Lenses, Spatial resolution

Proceedings Article | 3 November 2004 Paper
Proceedings Volume 5537, (2004) https://doi.org/10.1117/12.560173
KEYWORDS: Multilayers, Zone plates, Diffraction, X-rays, Hard x-rays, X-ray optics, Multiple scattering, Synchrotrons, Scattering, X-ray diffraction

Proceedings Article | 3 November 2004 Paper
Proceedings Volume 5537, (2004) https://doi.org/10.1117/12.561399
KEYWORDS: Silicon, X-rays, Reflectivity, Multilayers, Monochromators, Absorption, Interfaces, X-ray diffraction, Sputter deposition, Synchrotron radiation

SPIE Journal Paper | 1 December 2003
OE, Vol. 42, Issue 12, (December 2003) https://doi.org/10.1117/12.10.1117/1.1625381
KEYWORDS: Mirrors, Coating, Gold, X-rays, Silicon, Polishing, Surface finishing, Metrology, Optical engineering, Spherical lenses

Showing 5 of 21 publications
Conference Committee Involvement (13)
Advances in X-Ray/EUV Optics and Components XVII
22 August 2022 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XVI
2 August 2021 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XV
26 August 2020 | Online Only, California, United States
Advances in X-Ray/EUV Optics and Components XIV
14 August 2019 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XIII
20 August 2018 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XII
8 August 2017 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XI
31 August 2016 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components X
11 August 2015 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components IX
19 August 2014 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components VIII
26 August 2013 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components VII
13 August 2012 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components VI
22 August 2011 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components V
2 August 2010 | San Diego, California, United States
Showing 5 of 13 Conference Committees
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