Prof. Raymond F. Mercier
at Institut d'Astrophysique Spatiale
SPIE Involvement:
Author
Publications (23)

Proceedings Article | 12 July 2019 Open Access Paper
A. Mazzoli, J. -P. Halain, F. Auchère, J. Barbay, S. Meining, A. Philippon, G. Morinaud, S. Roose, M. -L. Hellin, L. Jacques, U. Schühle, C. Dumesnil, R. Mercier, E. Renotte, P. Rochus
Proceedings Volume 11180, 111801O (2019) https://doi.org/10.1117/12.2535979
KEYWORDS: Mirrors, Optical alignment, Interferometry, Imaging systems, Telescopes, Extreme ultraviolet, Interferometers, 3D metrology, Wavefronts, Channel projecting optics

Proceedings Article | 6 July 2018 Presentation + Paper
J.-P. Halain, E. Renotte, F. Auchère, D. Berghmans, F. Delmotte, L. Harra, W. Schmutz, U. Schühle, R. Aznar Cuadrado, C. Dumesnil, M. Gyo, T. Kennedy, C. Verbeeck, J. Barbay, B. Giordanengo, S. Gissot , A. Gottwald, K. Heerlein, M.-L. Hellin, A. Hermans, V. Hervier, L. Jacques, C. Laubis, A. Mazzoli, S. Meining, R. Mercier, A. Philippon, S. Roose, L. Rossi, F. Scholze, P. Smith, L. Teriaca, X. Zhang, P. Rochus
Proceedings Volume 10699, 106990H (2018) https://doi.org/10.1117/12.2309339
KEYWORDS: Extreme ultraviolet, Calibration, Cameras, Mirrors, Optical alignment, Sensors, Telescopes, Interferometry, Fermium, Frequency modulation

Proceedings Article | 21 November 2017 Open Access Paper
Raymond Mercier, Michel Mullot, Michel Lamare
Proceedings Volume 10569, 1056909 (2017) https://doi.org/10.1117/12.2307947
KEYWORDS: Wavefronts, Interferometry, Ions, Interferometers, Distortion, Telescopes, Reflection, Diffraction, Sensors, Polishing

Proceedings Article | 21 September 2015 Paper
J.-P. Halain, A. Mazzoli, S. Meining, P. Rochus, E. Renotte, F. Auchère, U. Schühle, F. Delmotte, C. Dumesnil, A. Philippon, R. Mercier, A. Hermans
Proceedings Volume 9604, 96040H (2015) https://doi.org/10.1117/12.2185631
KEYWORDS: Mirrors, Sensors, Optical alignment, Extreme ultraviolet, Interferometry, Imaging systems, Optical design, Staring arrays, Aluminum, Bandpass filters

Proceedings Article | 21 September 2015 Paper
J.-P. Halain, P. Rochus, E. Renotte, A. Hermans, L. Jacques, F. Auchère, D. Berghmans, L. Harra, U. Schühle, W. Schmutz, A. Zhukov, R. Aznar Cuadrado, F. Delmotte, C. Dumesnil, M. Gyo, T. Kennedy, P. Smith, J. Tandy, R. Mercier, C. Verbeeck
Proceedings Volume 9604, 96040G (2015) https://doi.org/10.1117/12.2185634
KEYWORDS: Scanning tunneling microscopy, Fermium, Frequency modulation, Instrument modeling, Extreme ultraviolet, Optical filters, Sensors, Space operations, Imaging systems, Manufacturing

Showing 5 of 23 publications
Conference Committee Involvement (4)
Optical Fabrication, Testing, and Metrology IV
7 September 2011 | Marseille, France
Optical Fabrication, Testing, and Metrology III
2 September 2008 | Glasgow, Scotland, United Kingdom
Optical Fabrication, Testing, and Metrology II
13 September 2005 | Jena, Germany
Optical Fabrication, Testing, and Metrology
30 September 2003 | St. Etienne, France
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