Robert A. Mitchell
Research Scientist at Voss Scientific LLC
SPIE Involvement:
Author
Area of Expertise:
Modeling , Simulations , Femtosecond pulse , Particle-In-Cell , Laser Damage , LIPSS
Publications (5)

Proceedings Article | 23 November 2015 Paper
Robert Mitchell, Douglass Schumacher, Enam Chowdhury
Proceedings Volume 9632, 96320Y (2015) https://doi.org/10.1117/12.2195006
KEYWORDS: Optical simulations, Pulsed laser operation, Particles, Laser induced damage, Electrons, Plasma, Femtosecond phenomena, Laser processing, Copper, Thermal modeling, Dielectrics

Proceedings Article | 23 November 2015 Paper
Enam Chowdhury, Kyle Kafka, Robert Mitchell, Alex Russell, Kevin Werner, Noah Talisa, Hui Li, Allen Yi, Douglass Schumacher
Proceedings Volume 9632, 96320R (2015) https://doi.org/10.1117/12.2195787
KEYWORDS: Copper, Femtosecond phenomena, Laser ablation, Optical simulations, Photonic integrated circuits, Laser induced damage, Pulsed laser operation, Crystals, Electrons, Laser crystals

Proceedings Article | 31 October 2014 Paper
Robert Mitchell, Douglass Schumacher, Enam Chowdhury
Proceedings Volume 9237, 92370X (2014) https://doi.org/10.1117/12.2068228
KEYWORDS: Photonic integrated circuits, Laser induced damage, Chemical species, Optical simulations, Copper, Particles, Femtosecond phenomena, Pulsed laser operation, Laser damage threshold, 3D modeling

SPIE Journal Paper | 23 July 2014
Robert Mitchell, Douglass Schumacher, Enam Chowdhury
OE, Vol. 53, Issue 12, 122507, (July 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.12.122507
KEYWORDS: Photonic integrated circuits, Laser induced damage, Particles, Femtosecond phenomena, Optical simulations, Electrons, Ionization, Chemical species, Copper, Monte Carlo methods

Proceedings Article | 14 November 2013 Paper
Robert Mitchell, Douglass Schumacher, Enam Chowdhury
Proceedings Volume 8885, 88851U (2013) https://doi.org/10.1117/12.2030229
KEYWORDS: Photonic integrated circuits, Particles, Laser induced damage, Femtosecond phenomena, Electrons, Chemical species, Optical simulations, Copper, Picosecond phenomena, Ionization

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