Dr. Robert L. Thornton
Chief Strategist at r.l.thornton and associates
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 10 January 2002 Paper
Proceedings Volume 4342, (2002) https://doi.org/10.1117/12.453378
KEYWORDS: Near field, Polarization, Metals, Resonance enhancement, Finite-difference time-domain method, Laser systems engineering, Optical storage, Scattering, Semiconductor lasers, Numerical simulations

Proceedings Article | 14 April 1999 Paper
Christopher Chua, Robert Thornton, David Treat, Rose Donaldson
Proceedings Volume 3626, (1999) https://doi.org/10.1117/12.345433
KEYWORDS: Polarization, Vertical cavity surface emitting lasers, Dielectric polarization, Crystals, Mirrors, Semiconducting wafers, Switches, Photomicroscopy, Polarizers, Oxidation

Proceedings Article | 14 April 1999 Paper
Christopher Chua, Robert Thornton, David Treat, Rose Donaldson
Proceedings Volume 3626, (1999) https://doi.org/10.1117/12.345418
KEYWORDS: Vertical cavity surface emitting lasers, Nonimpact printing, Electrodes, Printing, Semiconducting wafers, Laser applications, Mirrors, Metals, Light emitting diodes, Oxidation

Proceedings Article | 4 May 1998 Paper
Proceedings Volume 3285, (1998) https://doi.org/10.1117/12.307593
KEYWORDS: Fourier transforms, Semiconductor lasers, Laser resonators, Resonators, Fabry–Perot interferometers, Laser scattering, Mirrors, Absorption, Reflectivity, Scattering

Proceedings Article | 4 April 1997 Paper
Proceedings Volume 3003, (1997) https://doi.org/10.1117/12.271057
KEYWORDS: Vertical cavity surface emitting lasers, Nonimpact printing, Printing, Chemical elements, Light emitting diodes, Semiconductor lasers, Edge emitting semiconductor lasers, Modulation, Optical design, Infrared radiation

Showing 5 of 7 publications
Conference Committee Involvement (3)
Testing and Reliability of Optelectronic Devices
26 January 2001 | San Jose, CA, United States
Testing, Packaging, and Reliability of Semiconductors Lasers V
26 January 2000 | San Jose, CA, United States
Testing, Packaging, and Reliability of Semiconductor Lasers IV
28 January 1999 | San Jose, CA, United States
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