Rotem Gazit
Electronics & Software Development Manager at SCD Semiconductor Devices
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 7 May 2019 Presentation + Paper
R. Gazit, D. Chen, G. Gershon, A. Karabchevsky, Z. Kiblitski, O. Magen, T. Markovitz , R. Ohayon, O. Rozenberg, K. Rozenshein, N. Syrel, I. Vladovsky, M. Weinstein, I. Shtrichman, S. Riabzev
Proceedings Volume 11002, 110021W (2019) https://doi.org/10.1117/12.2517745
KEYWORDS: Sensors, Nonuniformity corrections, Image enhancement, Imaging systems, Image processing, Mid-IR, Video processing

Proceedings Article | 9 May 2018 Paper
I. Hirsh, E. Louzon, A. Aharon, R. Gazit, D. Bar, P. Kondrashov, M. Weinstein, M. Savchenko, M. Regensburger, A. Navon, E. Shunam, O. Rahat, A. Mediouni, E. Mor, A. Shay, R. Iosevich, M. Ben-Ezra, A. Tuito, I. Shtrichman
Proceedings Volume 10624, 1062406 (2018) https://doi.org/10.1117/12.2303705
KEYWORDS: Video, Short wave infrared radiation, Imaging systems, Sensors, Image enhancement, Staring arrays, Image processing, Indium gallium arsenide, Image intensifiers, Nonuniformity corrections

Proceedings Article | 21 May 2011 Paper
F. Schapiro, Y. Milstain, A. Aharon, A. Neboshchik, Y. Ben-Simon, I. Kogan, I. Lerman, U. Mizrahi, S. Maayani, A. Amsterdam, I. Vaserman, O. Duman, R. Gazit
Proceedings Volume 8012, 80121D (2011) https://doi.org/10.1117/12.883117
KEYWORDS: Digital signal processing, Video, Video processing, Sensors, Single crystal X-ray diffraction, Image processing, Infrared imaging, Analog electronics, Nonuniformity corrections, Connectors

Proceedings Article | 28 October 2010 Paper
R. Gazit, A. Neboshchik, Y. Ben-Simon, I. Kogan, A. Aharon, I. Lerman, M. Katz, U. Mizrahi, S. Maayani, A. Amsterdam, I. Vaserman, O. Duman, F. Schapiro, A. Frenkel
Proceedings Volume 7834, 783406 (2010) https://doi.org/10.1117/12.865129
KEYWORDS: Video, Sensors, Single crystal X-ray diffraction, Digital signal processing, Video processing, Image processing, Infrared imaging, Detection and tracking algorithms, Nonuniformity corrections, Analog electronics

Proceedings Article | 7 May 2009 Paper
O. Nesher, I. Pivnik, E. Ilan, Z. Calalhorra, A. Koifman, I. Vaserman, J. Oiknine Schlesinger, R. Gazit, I. Hirsh
Proceedings Volume 7298, 72983K (2009) https://doi.org/10.1117/12.817054
KEYWORDS: Sensors, Readout integrated circuits, Single crystal X-ray diffraction, Signal processing, Staring arrays, CMOS technology, Infrared detectors, Image resolution, Analog electronics, Signal detection

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