Dr. Rui Jiang
at illumina Inc
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 13 March 2012 Paper
Theodore Cacouris, Rajasekhar Rao, Rostislav Rokitski, Rui Jiang, John Melchior, Bernd Burfeindt, Kevin O'Brien
Proceedings Volume 8326, 83261G (2012) https://doi.org/10.1117/12.917827
KEYWORDS: Light sources, Lithography, Metrology, Deep ultraviolet, Double patterning technology, Optical lithography, Optical testing, Light, Neodymium, High volume manufacturing

Proceedings Article | 23 March 2011 Paper
Kevin O'Brien, Rui Jiang, Nora Han, Efrain Figueroa, Raj Rao, Robert Rafac
Proceedings Volume 7973, 797326 (2011) https://doi.org/10.1117/12.881167
KEYWORDS: Metrology, Control systems, Light sources, Laser stabilization, Lithography, Light, Laser drilling, Switching, Sensors, Optical testing

Proceedings Article | 4 March 2010 Paper
Rostislav Rokitski, Toshi Ishihara, Rajeskar Rao, Rui Jiang, Mary Haviland, Theodore Cacouris, Daniel Brown
Proceedings Volume 7640, 76401Q (2010) https://doi.org/10.1117/12.849065
KEYWORDS: Light sources, Double patterning technology, Reliability, Immersion lithography, Electrodes, Lithography, Scanners, Deep ultraviolet, Optical proximity correction, Excimer lasers

Proceedings Article | 11 December 2009 Paper
Slava Rokitski, Toshi Ishihara, Rajeskar Rao, Rui Jiang, Daniel Riggs, Mary Haviland, Theodore Cacouris, Daniel Brown
Proceedings Volume 7520, 752013 (2009) https://doi.org/10.1117/12.839803
KEYWORDS: Light sources, Double patterning technology, Control systems, Scanners, Immersion lithography, Lithography, Deep ultraviolet, Polarization, Optical proximity correction, High volume manufacturing

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