Prof. Russell M. Gwilliam Profile

Prof. Russell M. Gwilliam

Director of Technology at UNIVERSITY OF SURREY

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Author

Publications (15)

Proceedings Article | 7 March 2014 Paper

Optical and electronic properties of bismuth-implanted glasses

M. Hughes, Y. Federenko, T. Lee, J. Yao, B. Gholipour, R. Gwilliam, K. Homewood, D. Hewak, S. Elliott, R. Curry

Proceedings Volume 8982, 898216 (2014) https://doi.org/10.1117/12.2036933

KEYWORDS: Glasses, Bismuth, Crystals, Chalcogenide glass, Doping, Silica, Oxides, Chalcogenides, Absorption, Near infrared

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Proceedings Article | 7 March 2014 Paper

Electrical properties of amorphous chalcogenide/silicon heterojunctions modified by ion implantation

Yanina Fedorenko, Mark Hughes, Julien Colaux, C. Jeynes, Russell Gwilliam, Kevin Homewood, Jin Yao, Dan Hewak, Tae-Hoon Lee, Stephen Elliott, B. Gholipour, Richard Curry

Proceedings Volume 8982, 898213 (2014) https://doi.org/10.1117/12.2037965

KEYWORDS: Bismuth, Ferroelectric materials, Interfaces, Chalcogenides, Silicon, Ion implantation, Doping, Heterojunctions, Electrons, Chalcogenide glass

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Proceedings Article | 27 February 2014 Paper

Femtosecond pulse generation from a two-section mode-locked quantum-dot laser using random population

P. Finch, P. Blood, P. Smowton, A. Sobiesierski, R. Gwilliam, I. O'Driscoll

Proceedings Volume 9002, 90020E (2014) https://doi.org/10.1117/12.2039130

KEYWORDS: Mode locking, Picosecond phenomena, Temperature metrology, Absorption, Phonons, Quantum dots, Pulsed laser operation, Quantum dot lasers, Optical testing, Oscillators

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Proceedings Article | 17 January 2011 Paper

Low-energy silicon-on-insulator ion implanted gratings for optical wafer scale testing

Renzo Loiacono, Graham Reed, Goran Mashanovich, Russell Gwilliam, Giorgio Lulli, Ran Feldesh, Richard Jones

Proceedings Volume 7943, 794310 (2011) https://doi.org/10.1117/12.873288

KEYWORDS: Semiconducting wafers, Waveguides, Ions, Wafer testing, Silicon, Optical testing, Wafer-level optics, Silicon photonics, Fiber Bragg gratings, Ion implantation

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Proceedings Article | 17 February 2010 Paper

Formation of Si-nanocrystals in SiO2 via ion implantation and rapid thermal processing

Iain Crowe, Oksana Hulko, Andrew Knights, Nicholas Hylton, Matthew Halsall, Simon Ruffell, Russell Gwilliam

Proceedings Volume 7606, 76061K (2010) https://doi.org/10.1117/12.852924

KEYWORDS: Raman spectroscopy, Silicon, Annealing, Oxides, Nanocrystals, Transmission electron microscopy, Diffusion, Phonons, Silica, Temperature metrology

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Proceedings Article | 17 February 2010 Paper

Germanium implanted Bragg gratings in silicon on insulator waveguides

Renzo Loiacono, Graham Reed, Russell Gwilliam, Goran Mashanovich, Liam O'Faolain, Thomas Krauss, Giorgio Lulli, Chris Jeynes, Richard Jones

Proceedings Volume 7606, 76060G (2010) https://doi.org/10.1117/12.839502

KEYWORDS: Silicon, Waveguides, Refractive index, Germanium, Ion implantation, Fiber Bragg gratings, Ions, Ellipsometry, Statistical analysis, Optical fabrication

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Proceedings Article | 17 February 2010 Paper

Optical spectroscopy of Er doped Si-nanocrystals on sapphire substrates fabricated by ion implantation into SiO2

N. Hylton, I. Crowe, A. Knights, M. Halsall, S. Ruffell, R. Gwilliam

Proceedings Volume 7606, 760604 (2010) https://doi.org/10.1117/12.852922

KEYWORDS: Erbium, Luminescence, Annealing, Silica, Silicon, Ions, Sapphire, Temperature metrology, Spectroscopy, Absorption

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Proceedings Article | 17 February 2010 Paper

Effects of annealing silicon ion irradiated rib waveguides with respect to free carrier lifetime

Nicholas Wright, Andrew Smith, Konstantin Litvinenko, Russell Gwilliam, Goran Mashanovich, Graham Reed

Proceedings Volume 7606, 76060H (2010) https://doi.org/10.1117/12.838582

KEYWORDS: Waveguides, Silicon, Oxides, Annealing, Raman spectroscopy, Ions, Absorption, Wave propagation, Temperature metrology, Hydrogen

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Proceedings Article | 20 May 2009 Paper

Silicon photonics at the University of Surrey

G. Reed, G. Mashanovich, F. Gardes, R. Gwilliam, N. Wright, D. Thomson, B. Timotijevic, K. Litvinenko, W. Headley, A. Smith, A. Knights, P. Jessop, N. Tarr, J.H. Deane

Proceedings Volume 7366, 736602 (2009) https://doi.org/10.1117/12.823291

KEYWORDS: Waveguides, Silicon, Modulators, Silicon photonics, Polarization, Modulation, Resonators, Doping, Optical filters, Birefringence

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Proceedings Article | 18 February 2009 Paper

Free carrier lifetime modification in silicon

N. Wright, D. Thomson, K. Litvinenko, W. Headley, A. Smith, A. Knights, J. H. B. Deane, F. Gardes, G. Mashanovich, R. Gwilliam, G. Reed

Proceedings Volume 7220, 722006 (2009) https://doi.org/10.1117/12.810907

KEYWORDS: Waveguides, Silicon, Raman spectroscopy, Ions, Ion implantation, Absorption, Wave propagation, Optical amplifiers, Optical testing, Raman scattering

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Proceedings Article | 9 February 2007 Paper

Novel fabrication techniques for silicon photonics

G. Reed, P. Yang, W. Headley, P. Waugh, G. Mashanovich, D. Thomson, R. Gwilliam, E. Teo, D. Blackwood, M.B. Breese, A. Bettiol

Proceedings Volume 6477, 64770E (2007) https://doi.org/10.1117/12.705180

KEYWORDS: Waveguides, Silicon, Fabrication, Silicon photonics, Ion implantation, Refractive index, Oxygen, Etching, Fiber Bragg gratings, Wave propagation

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Proceedings Article | 11 November 2002 Paper

Efficient optical sources in silicon using dislocation engineering

Russell Gwilliam, M. Lourenco, S. Galata, Kevin Homewood, G. Shao

Proceedings Volume 4823, (2002) https://doi.org/10.1117/12.452222

KEYWORDS: Temperature metrology, Silicon, Electroluminescence, Control systems, Luminescence, Integration, Optics manufacturing, Light emitting diodes, Boron, Nitrogen

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Proceedings Article | 27 March 2002 Paper

Dislocation-engineered silicon light-emitting diodes

Manon Lourenco, Wei Lek Ng, Gousheng Shao, Russell Gwilliam, Kevin Homewood

Proceedings Volume 4654, (2002) https://doi.org/10.1117/12.463848

KEYWORDS: Silicon, Electroluminescence, Luminescence, Temperature metrology, Light emitting diodes, Annealing, Boron, Measurement devices, Integration, Crystals

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Proceedings Article | 2 February 2001 Paper

Hybrid silicon-organic light-emitting diodes for 1.5-um optoelectronics

Richard Curry, William Gillin, M. Somerton, Andrew Knights, Russell Gwilliam

Proceedings Volume 4105, (2001) https://doi.org/10.1117/12.416903

KEYWORDS: Silicon, Diodes, Electroluminescence, Erbium, Organic light emitting diodes, Luminescence, Aluminum, Ions, Optoelectronics, Electron transport

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Proceedings Article | 15 March 2000 Paper

Light-emitting diodes fabricated in silicon/iron disilicide

Adrian Kewell, Manon Lourenco, Russell Gwilliam, Jane Sharpe, C. McKinty, Thomas Butler, Karen Reeson Kirkby, Kevin Homewood

Proceedings Volume 3953, (2000) https://doi.org/10.1117/12.379615

KEYWORDS: Luminescence, Sensors, Semiconducting wafers, Diodes, Information operations, Semiconductors, Light emitting diodes, Iron, Silicon, Electroluminescence

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Showing 5 of 15 publications

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