CONFERENCE PROCEEDINGS
Advanced Search
Dr. Sameer K. Ajmera
Director, FPA/Materials Development at DRS Electro-Optical Infrared Systems
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 31 May 2012 Paper
Uncooled silicon germanium oxide (Si[sub]x[/sub]Ge[sub]y[/sub]O[sub]1-x-y[/sub]) thin films for infrared detection
Proceedings Volume 8353, 835317 (2012) https://doi.org/10.1117/12.919708
KEYWORDS: Silicon, Oxygen, Germanium, Silicon films, Thin films, Temperature metrology, Microbolometers, Resistance, Oxides, X-ray diffraction
Proceedings Article | 21 May 2011 Paper
Performance improvement in amorphous silicon based uncooled microbolometers through pixel design and materials development
Proceedings Volume 8012, 80121L (2011) https://doi.org/10.1117/12.884249
KEYWORDS: Amorphous silicon, Hydrogen, Staring arrays, Microbolometers, Sensors, Readout integrated circuits, Capacitors, Resistance, Bolometers, Packaging
Proceedings Article | 28 July 2010 Paper
Small pixel a-Si/a-SiGe bolometer focal plane array technology at L-3 Communications
Charles Hanson, Sameer Ajmera, John Brady, Thomas Fagan, William McCardel, Diane Morgan, Tom Schimert, A. J. Syllaios, Michael Taylor
Proceedings Volume 7660, 76600R (2010) https://doi.org/10.1117/12.852511
KEYWORDS: Staring arrays, Amorphous silicon, Capacitors, Digital filtering, Packaging, Sensors, Semiconducting wafers, Readout integrated circuits, Electronic filtering, Infrared radiation
Proceedings Article | 4 May 2010 Paper
Amorphous silicon thin-films for uncooled infrared microbolometer sensors
Sameer Ajmera, A. Syllaios, Greg Tyber, Michael Taylor, Russell Hollingsworth
Proceedings Volume 7660, 766012 (2010) https://doi.org/10.1117/12.850545
KEYWORDS: Amorphous silicon, Microbolometers, Hydrogen, Thin films, Temperature metrology, Plasma, Infrared sensors, Sensors, Resistance, Infrared radiation
Proceedings Article | 17 April 2008 Paper
Amorphous silicon-based large-format uncooled FPA microbolometer technology
T. Schimert, J. Brady, T. Fagan, M. Taylor, W. McCardel, R. Gooch, S. Ajmera, C. Hanson, A. Syllaios
Proceedings Volume 6940, 694023 (2008) https://doi.org/10.1117/12.784661
KEYWORDS: Staring arrays, Packaging, Amorphous silicon, Capacitors, Microbolometers, Semiconducting wafers, Infrared radiation, Digital filtering, Thermography, Standard readout integrated circuits
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top