Dr. Sascha Feistkorn
at SVTI
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 April 2020 Presentation + Paper
Proceedings Volume 11409, 114090C (2020) https://doi.org/10.1117/12.2556853
KEYWORDS: Inspection, Thermography, Manufacturing, Phase measurement, Nondestructive evaluation, Scanning electron microscopy, Diffusion, Thermal modeling, Statistical analysis, Signal to noise ratio

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