Dr. Serge Bidnyk Profile

Dr. Serge Bidnyk

Optical Design Director at Enablence Technologies

SPIE Involvement:

Author

Publications (18)

Proceedings Article | 13 March 2024 Presentation + Paper

Enabling high-volume production of photonics chips with machine learning

K. Yadav, S. Bidnyk, A. Balakrishnan

Proceedings Volume 12903, 129030A (2024) https://doi.org/10.1117/12.3002822

KEYWORDS: Photonics, Machine learning, Neural networks, Fabrication, Multiplexers, Chip manufacturing, Artificial intelligence, Integrated photonics, Photonic integrated circuits

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Leveraging the power of machine learning, we introduce a breakthrough approach in high-volume manufacturing of photonics chips for advanced applications. Despite the transformative potential of photonics in many industries, its widespread adoption has been hindered by multiple challenges in the fabrication of complex integrated chips. We deployed machine learning models with diverse architectures at every stage of our manufacturing process to overcome these challenges. Inevitable variations in the fabrication process often lead to performance variability among photonics chips on a single wafer and across different wafers. We effectively overcome this challenge by employing a deep neural network to study the variability in the performance of individual chips, enabling us to predict the precise optimizations necessary to compensate for inevitable process variations. We describe our selection of the deep neural network architecture that addresses this challenge, our methodology for obtaining a high-quality dataset for training, and the enhancements in performance uniformity achieved through machine learning-enhanced production masks. Moreover, our use of machine learning has allowed us to bypass the time-consuming and labour-intensive process of optical chip testing, which significantly limits the scalability of photonic deployments in high-volume applications. As a powerful alternative to such testing, we developed a new technology that relies on a wafer probe that collects metrology data from multitude of locations on an undiced wafer. Utilizing a support vector machine (SVM), we analyze this metrology data and employ nonlinear binary classification to accurately predict the performance of hundreds of chips on a wafer across various metrics. We describe the approach employed for data collection to train the model, the trade-offs involved in hyperparameter tuning, and our methodology for evaluating the predictive quality of the binary classifiers. Additionally, we highlight the new capability of in-situ monitoring of wafer fabrication, which enables high-volume production and deployment of photonic solutions.

Proceedings Article | 12 March 2024 Presentation + Paper

Systems-on-chip in monolithically integrated silica-on-silicon platform

S. Bidnyk, K. Yadav, A. Balakrishnan

Proceedings Volume 12889, 1288908 (2024) https://doi.org/10.1117/12.3002708

KEYWORDS: LIDAR, Photonic integrated circuits, Arrayed waveguide gratings, Optical computing, Polarization, Integrated optics, Polarization control, Photonics, Photonic devices

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Proceedings Article | 17 March 2023 Presentation + Paper

Enabling advanced photonic architectures using state-of-the-art silica-on-silicon planar lightwave circuit platform

S. Bidnyk, K. Yadav, S.-H. Liu, A. Balakrishnan

Proceedings Volume 12424, 1242406 (2023) https://doi.org/10.1117/12.2647016

KEYWORDS: Photonic integrated circuits, Optical coherence tomography, Polarization, LIDAR, Telecommunications, Optics manufacturing, Machine learning, Polarization control, Waveguides, Silica

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Proceedings Article | 15 March 2023 Presentation + Paper

Machine learning for design optimizations and prediction of optical chip performance

K. Yadav, S. Bidnyk, A. Balakrishnan

Proceedings Volume 12438, 124380E (2023) https://doi.org/10.1117/12.2647618

KEYWORDS: Semiconducting wafers, Design and modelling, Machine learning, Wafer-level optics, Optics manufacturing, Integrated optics, Fabrication, Education and training, Photonics, Photonic integrated circuits

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Proceedings Article | 5 March 2022 Presentation + Paper

Synthesis of ultra-dense interferometric chains in planar lightwave circuits

S. Bidnyk, K. Yadav, A. Balakrishnan

Proceedings Volume 12004, 120040F (2022) https://doi.org/10.1117/12.2626308

KEYWORDS: Waveguides, Multiplexers, Photonic integrated circuits, Interferometry, Refractive index, Polarization, Local area networks, Interferometers, Wavelength division multiplexing, Integrated optics

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Proceedings Article | 27 January 2011 Paper

Large-scale planar lightwave circuits

Serge Bidnyk, Hua Zhang, Matt Pearson, Ashok Balakrishnan

Proceedings Volume 7941, 794102 (2011) https://doi.org/10.1117/12.871803

KEYWORDS: Photonic integrated circuits, Waveguides, Photodetectors, Optical components, Diffraction gratings, Integrated optics, Signal processing, Semiconducting wafers, Silicon, Refractive index

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Proceedings Article | 16 April 2010 Paper

Hybrid planar lightwave circuits for defense and aerospace applications

Hua Zhang, Serge Bidnyk, Shiquan Yang, Ashok Balakrishnan, Matt Pearson, Sean O'Keefe

Proceedings Volume 7700, 77000B (2010) https://doi.org/10.1117/12.849954

KEYWORDS: Photonic integrated circuits, Transceivers, Aerospace engineering, Defense and security, Silica, Fiber optic communications, Optical fibers, Optical communications, Palladium, Optical alignment

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Proceedings Article | 26 October 2007 Paper

Recent progress in design and hybridization of planar grating-based transceivers

S. Bidnyk, M. Pearson, A. Balakrishnan, M. Gao

Proceedings Volume 6796, 67963H (2007) https://doi.org/10.1117/12.778930

KEYWORDS: Diffraction gratings, Transceivers, Reflectivity, Waveguides, Diffraction, Photonic integrated circuits, Optical design, Mach-Zehnder interferometers, Photodetectors, Interferometers

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Proceedings Article | 9 February 2007 Paper

SOI waveguide based planar reflective grating demultiplexer for FTTH

S. Bidnyk, D. Feng, A. Balakrishnan, M. Pearson, M. Gao, H. Liang, W. Qian, C.-C. Kung, J. Fong, J. Yin, M. Asghari

Proceedings Volume 6477, 64770F (2007) https://doi.org/10.1117/12.698172

KEYWORDS: Fiber to the x, Reflectivity, Diffraction gratings, Silicon, Mach-Zehnder interferometers, Waveguides, Demultiplexers, Interferometers, Optics manufacturing, Photonic integrated circuits

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Proceedings Article | 9 February 2007 Paper

Hybridization of active and passive elements for planar photonic components and interconnects

M. Pearson, S. Bidnyk, A. Balakrishnan

Proceedings Volume 6478, 64780L (2007) https://doi.org/10.1117/12.714296

KEYWORDS: Photonic integrated circuits, Fiber to the x, Transceivers, Reflectivity, Packaging, Diffraction gratings, Optical filters, Optics manufacturing, Photodetectors, Silicon

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Proceedings Article | 24 February 2006 Paper

Cascaded planar reflective gratings

S. Bidnyk, M. Pearson, A. Balakrishnan, M. Gao

Proceedings Volume 6123, 61230O (2006) https://doi.org/10.1117/12.643145

KEYWORDS: Dispersion, Reflectivity, Diffraction gratings, Diffraction, Waveguides, Optical design, Channel projecting optics, Additive manufacturing, Refractive index, Manufacturing

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Proceedings Article | 13 October 2005 Paper

Optical add/drop multiplexer based on subtractive dispersion planar reflective gratings

S. Bidnyk, M. Pearson, A. Balakrishnan, M. Gao

Proceedings Volume 5970, 597023 (2005) https://doi.org/10.1117/12.628625

KEYWORDS: Reflectivity, Diffraction gratings, Waveguides, Dispersion, Networks, Multiplexers, Manufacturing, Refractive index, Optical design, Diffraction

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Proceedings Article | 31 March 2005 Paper

Narrow and wide free spectral range devices based on planar reflective gratings

Serge Bidnyk, Matthew Pearson, Ashok Balakrishnan, Mae Gao

Proceedings Volume 5728, (2005) https://doi.org/10.1117/12.589339

KEYWORDS: Coarse wavelength division multiplexing, Waveguides, Reflectivity, Optical design, Manufacturing, Refractive index, Dense wavelength division multiplexing, Diffraction gratings, Etching, Semiconducting wafers

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Proceedings Article | 18 April 2000 Paper

Comparative study of near-threshold gain mechanisms in GaN epilayers and GaN/AlGaN separate confinement heterostructures

Sergiy Bidnyk, Jack Lam, Brian Little, Gordon Gainer, Yong Kwon, Jin-Joo Song, Gary Bulman, Hua-Shuang Kong

Proceedings Volume 3947, (2000) https://doi.org/10.1117/12.382095

KEYWORDS: Gallium nitride, Temperature metrology, Scattering, Excitons, Ultraviolet radiation, Heterojunctions, Silicon carbide, Solids, Optical pumping, Optical microcavities

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Proceedings Article | 12 November 1999 Paper

Stimulated emission and pump-probe studies of wide-gap nitrides for UV-blue photonic applications

Jin-Joo Song, Sergiy Bidnyk, Theodore Schmidt

Proceedings Volume 3896, (1999) https://doi.org/10.1117/12.370335

KEYWORDS: Gallium nitride, Excitons, Absorption, Scattering, Indium gallium nitride, Temperature metrology, Ultraviolet radiation, Thin films, Aluminum, Deep ultraviolet

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Proceedings Article | 6 August 1999 Paper

Comparative study of near-threshold stimulated emission mechanisms in GaN epilayers and InGaN/GaN multiquantum wells

Sergiy Bidnyk, Theodore Schmidt, Brian Little, Jerzy Krasinski, Jin-Joo Song, Stacia Keller, Steven DenBaars

Proceedings Volume 3625, (1999) https://doi.org/10.1117/12.356931

KEYWORDS: Gallium nitride, Temperature metrology, Excitons, Scattering, Indium gallium nitride, Quantum wells, Sapphire, Silicon carbide, Thin films, Plasma

Proceedings Article | 6 August 1999 Paper

Nonlinear optical spectroscopy of band tail states in highly excited InGaN

Theodore Schmidt, Yong-Hoon Cho, Sergiy Bidnyk, Jin-Joo Song, Stacia Keller, Umesh Mishra, Steven DenBaars

Proceedings Volume 3625, (1999) https://doi.org/10.1117/12.356921

KEYWORDS: Absorption, Indium gallium nitride, Spectroscopy, Gallium nitride, Silicon, Optical spectroscopy, Optical pumping, Solids, Quantum wells, Indium

Proceedings Article | 22 June 1998 Paper

High-temperature stimulated emission studies of MOCVD-grown GaN films

Sergiy Bidnyk, Brian Little, Theodore Schmidt, Jerzy Krasinski, Jin-Joo Song

Proceedings Volume 3419, 341906 (1998) https://doi.org/10.1117/12.311036

KEYWORDS: Gallium nitride, Temperature metrology, Sapphire, Silicon carbide, Optical pumping, Thin films, Metalorganic chemical vapor deposition, Plasma, Light scattering, Scattering

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Showing 5 of 18 publications

Conference Committee Involvement (2)

Ultrafast Phenomena in Semiconductors and Nanostructure Materials XIII

25 January 2009 | San Jose, California, United States

Ultrafast Phenomena in Semiconductors and Nanostructure Materials XII

20 January 2008 | San Jose, California, United States

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