Dr. Shaorong Xiao Profile

Dr. Shaorong Xiao

at Nanjing Univ of Information Science & Technology

SPIE Involvement:

Author

Publications (10)

Proceedings Article | 3 February 2009 Paper

The influences of fog on the width of laser pulse transmitting in atmosphere

XiaoLi Mao, ShaoRong Xiao, JianHua Chang, Xiang Tang

Proceedings Volume 7160, 71601U (2009) https://doi.org/10.1117/12.806708

KEYWORDS: Pulsed laser operation, Fiber optic gyroscopes, Light scattering, Scattering, Laser scattering, Atmospheric particles, Particles, Laser applications, Mass attenuation coefficient, Atmospheric optics

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Proceedings Article | 3 February 2009 Paper

Measurement of single mode fiber non-circularity based on image processing

Shaorong Xiao, Hen Hu, Xiaoli Mao, Bo Zhang

Proceedings Volume 7160, 716006 (2009) https://doi.org/10.1117/12.805642

KEYWORDS: Image processing, Single mode fibers, Cameras, Optical fibers, Microscopes, Digital cameras, Optical filters, CCD cameras, Prisms, Image filtering

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Proceedings Article | 3 February 2009 Paper

In-line Calibration of Phase Shifters for Interferometer Measurement

XuHua Wu, Lei Chen, Shaorong Xiao, YingChun Li

Proceedings Volume 7160, 71601D (2009) https://doi.org/10.1117/12.805502

KEYWORDS: Calibration, Phase shifts, Ferroelectric materials, Interferometers, Phase interferometry, Phase measurement, Computer simulations, Phase shift keying, Mirrors, Information science

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Proceedings Article | 27 January 2009 Paper

400mm aperture lidar system and its applications

Shaorong Xiao, Bo Zhang, Xiaoli Mao, Ji Zhao

Proceedings Volume 7156, 71560U (2009) https://doi.org/10.1117/12.805676

KEYWORDS: LIDAR, Atmospheric optics, Clouds, Telescopes, Laser systems engineering, Atmospheric particles, Pulsed laser operation, Spectroscopy, Signal detection, Signal processing

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Proceedings Article | 17 January 2008 Paper

Method for measuring optical fiber core no-circularity

Shao-rong Xiao, Xian-ling Zhang, Xiao-li Mao

Proceedings Volume 6723, 67230U (2008) https://doi.org/10.1117/12.783056

KEYWORDS: Optical fibers, Digital cameras, Microscopes, Digital image processing, Cladding, Beam splitters, Prisms, Image processing, Near field, Raster graphics

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Proceedings Article | 15 January 2008 Paper

Multi-path optical fiber sensor for atmospheric pressure

Shaorong Xiao, Jianhua Chang, Fulai Ben

Proceedings Volume 6836, 68361G (2008) https://doi.org/10.1117/12.765801

KEYWORDS: Sensors, Atmospheric sensing, Optical fibers, Fiber optics sensors, Atmospheric optics, Reflection, Receivers, Structured optical fibers, Inspection, Capacitors

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Proceedings Article | 18 January 2005 Paper

Inspecting polyaniline membrane with laser confocal scan microscope

Ganhui Huang, Shaoping Deng, Shaorong Xiao

Proceedings Volume 5630, (2005) https://doi.org/10.1117/12.576941

KEYWORDS: Platinum, Microscopes, Confocal microscopy, Polymers, Polymerization, Electrodes, Inspection, Objectives, Sensors, Sodium

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Proceedings Article | 9 September 2002 Paper

New set of measuring terrain atmospheric visibility with optical fiber

Shaorong Xiao, Jinbang Chen, Zhenhui Wang, Yong He

Proceedings Volume 4920, (2002) https://doi.org/10.1117/12.481972

KEYWORDS: Light scattering, Scattering, Visibility, Laser scattering, Atmospheric optics, Optical fibers, Signal processing, Mass attenuation coefficient, Optical testing, Scatter measurement

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Proceedings Article | 2 November 2000 Paper

Evaluating optical and supersmooth surface using AFM in optical maunfacturing technology

Jianbai Li, Shaorong Xiao, Xiaoyun Li, Aihan Ying, Anqing Zhao

Proceedings Volume 4099, (2000) https://doi.org/10.1117/12.405836

KEYWORDS: Surface finishing, Polishing, Coating, Optics manufacturing, Testing and analysis, Optical components, Surface roughness, Optical testing, X-ray optics, X-rays

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Proceedings Article | 5 August 1998 Paper

Testing method on nanometer-grade true microprofile of optical surface

Jianbai Li, Xiaoyun Li, Aihan Ying, Shaorong Xiao, Ming Wang, Anging Zhuo

Proceedings Volume 3557, (1998) https://doi.org/10.1117/12.318318

KEYWORDS: Semiconducting wafers, Surface finishing, Atomic force microscopy, Testing and analysis, Interferometers, Polishing, Optical testing, Coating, Atomic force microscope, Lithium

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Showing 5 of 10 publications

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